X-RAY PHOTOELECTRON DIFFRACTION INVESTIGATION OF THE (2 X-2) OVERLAYERS OF CS AND K ON CU (111)
UNSPECIFIED (1994) X-RAY PHOTOELECTRON DIFFRACTION INVESTIGATION OF THE (2 X-2) OVERLAYERS OF CS AND K ON CU (111). Surface Science, 320 (3). pp. 315-319. ISSN 0039-6028Full text not available from this repository.
X-ray photoelectron diffraction measurements have been made for the Cu(111)(2 X 2)-Cs and Cu(111)(2 X 2)-K systems to explore the possibility of using substrate emission XPD for the elucidation of adsorbate-substrate registry in these cases of strongly scattering adsorbate atoms and anticipated atop adsorption sites. Although scattering effects within the substrate, for sub-surface emitters, clearly complicate the interpretation of the data, simple symmetry arguments do give substantial support to the identification of atop adsorption sites in both systems.
|Item Type:||Journal Article|
|Subjects:||Q Science > QD Chemistry
Q Science > QC Physics
|Journal or Publication Title:||Surface Science|
|Publisher:||ELSEVIER SCIENCE BV|
|Date:||1 December 1994|
|Number of Pages:||5|
|Page Range:||pp. 315-319|
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