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X-RAY PHOTOELECTRON DIFFRACTION INVESTIGATION OF THE (2 X-2) OVERLAYERS OF CS AND K ON CU (111)
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UNSPECIFIED (1994) X-RAY PHOTOELECTRON DIFFRACTION INVESTIGATION OF THE (2 X-2) OVERLAYERS OF CS AND K ON CU (111). Surface Science, 320 (3). pp. 315-319. ISSN 0039-6028
Full text not available from this repository.Abstract
X-ray photoelectron diffraction measurements have been made for the Cu(111)(2 X 2)-Cs and Cu(111)(2 X 2)-K systems to explore the possibility of using substrate emission XPD for the elucidation of adsorbate-substrate registry in these cases of strongly scattering adsorbate atoms and anticipated atop adsorption sites. Although scattering effects within the substrate, for sub-surface emitters, clearly complicate the interpretation of the data, simple symmetry arguments do give substantial support to the identification of atop adsorption sites in both systems.
| Item Type: | Journal Article |
|---|---|
| Subjects: | Q Science > QD Chemistry Q Science > QC Physics |
| Journal or Publication Title: | Surface Science |
| Publisher: | ELSEVIER SCIENCE BV |
| ISSN: | 0039-6028 |
| Date: | 1 December 1994 |
| Volume: | 320 |
| Number: | 3 |
| Number of Pages: | 5 |
| Page Range: | pp. 315-319 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/20141 |
Data sourced from Thomson Reuters' Web of Knowledge
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