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X-RAY PHOTOELECTRON DIFFRACTION INVESTIGATION OF THE (2 X-2) OVERLAYERS OF CS AND K ON CU (111)
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UNSPECIFIED (1994) X-RAY PHOTOELECTRON DIFFRACTION INVESTIGATION OF THE (2 X-2) OVERLAYERS OF CS AND K ON CU (111). Surface Science, 320 (3). pp. 315-319. ISSN 0039-6028.
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Abstract
X-ray photoelectron diffraction measurements have been made for the Cu(111)(2 X 2)-Cs and Cu(111)(2 X 2)-K systems to explore the possibility of using substrate emission XPD for the elucidation of adsorbate-substrate registry in these cases of strongly scattering adsorbate atoms and anticipated atop adsorption sites. Although scattering effects within the substrate, for sub-surface emitters, clearly complicate the interpretation of the data, simple symmetry arguments do give substantial support to the identification of atop adsorption sites in both systems.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QD Chemistry Q Science > QC Physics |
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Journal or Publication Title: | Surface Science | ||||
Publisher: | ELSEVIER SCIENCE BV | ||||
ISSN: | 0039-6028 | ||||
Official Date: | 1 December 1994 | ||||
Dates: |
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Volume: | 320 | ||||
Number: | 3 | ||||
Number of Pages: | 5 | ||||
Page Range: | pp. 315-319 | ||||
Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
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