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POTENTIAL APPLICATIONS OF A NOVEL X-RAY SOURCE IN MATERIAL CHARACTERIZATION
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UNSPECIFIED (1994) POTENTIAL APPLICATIONS OF A NOVEL X-RAY SOURCE IN MATERIAL CHARACTERIZATION. In: Conference on Substance Detection Systems, INNSBRUCK, AUSTRIA, OCT 05-08, 1993. Published in: SUBSTANCE DETECTION SYSTEMS, 2092 pp. 411-416.
Full text not available from this repository.| Item Type: | Conference Item (UNSPECIFIED) | ||||
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| Subjects: | Q Science > QC Physics | ||||
| Series Name: | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) | ||||
| Journal or Publication Title: | SUBSTANCE DETECTION SYSTEMS | ||||
| Publisher: | SPIE - INT SOC OPTICAL ENGINEERING | ||||
| ISBN: | 0-8194-1365-8 | ||||
| Editor: | Harding, G and Lanza, RC and Myers, LJ and Young, PA | ||||
| Official Date: | 1994 | ||||
| Dates: |
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| Volume: | 2092 | ||||
| Number of Pages: | 6 | ||||
| Page Range: | pp. 411-416 | ||||
| Publication Status: | Published | ||||
| Title of Event: | Conference on Substance Detection Systems | ||||
| Location of Event: | INNSBRUCK, AUSTRIA | ||||
| Date(s) of Event: | OCT 05-08, 1993 | ||||
| URI: | http://wrap.warwick.ac.uk/id/eprint/20432 |
Data sourced from Thomson Reuters' Web of Knowledge
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