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FOURIER-ANALYSIS OF COMPLEX FILTERING IN THE TRANSFORM PLANE FOR OBTAINING NANOMETRIC SURFACES PROFILES
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UNSPECIFIED (1994) FOURIER-ANALYSIS OF COMPLEX FILTERING IN THE TRANSFORM PLANE FOR OBTAINING NANOMETRIC SURFACES PROFILES. In: Conference on Optics, Illumination, and Image Sensing for Machine Vision VIII, BOSTON, MA, SEP 08-09, 1993. Published in: OPTICS, ILLUMINATION, AND IMAGE SENSING FOR MACHINE VISION VIII, 2065 pp. 134-143. ISBN 0-8194-1330-5.
Full text not available from this repository, contact author.| Item Type: | Conference Item (UNSPECIFIED) | ||||
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| Subjects: | Q Science > QC Physics | ||||
| Series Name: | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) | ||||
| Journal or Publication Title: | OPTICS, ILLUMINATION, AND IMAGE SENSING FOR MACHINE VISION VIII | ||||
| Publisher: | SPIE - INT SOC OPTICAL ENGINEERING | ||||
| ISBN: | 0-8194-1330-5 | ||||
| Editor: | Svetkoff, DJ | ||||
| Official Date: | 1994 | ||||
| Dates: |
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| Volume: | 2065 | ||||
| Number of Pages: | 10 | ||||
| Page Range: | pp. 134-143 | ||||
| Publication Status: | Published | ||||
| Title of Event: | Conference on Optics, Illumination, and Image Sensing for Machine Vision VIII | ||||
| Location of Event: | BOSTON, MA | ||||
| Date(s) of Event: | SEP 08-09, 1993 |
Data sourced from Thomson Reuters' Web of Knowledge
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