UNSPECIFIED (1994) FOURIER-ANALYSIS OF COMPLEX FILTERING IN THE TRANSFORM PLANE FOR OBTAINING NANOMETRIC SURFACES PROFILES. In: Conference on Optics, Illumination, and Image Sensing for Machine Vision VIII, BOSTON, MA, SEP 08-09, 1993. Published in: OPTICS, ILLUMINATION, AND IMAGE SENSING FOR MACHINE VISION VIII, 2065 pp. 134-143.

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Item Type:	Conference Item (UNSPECIFIED)
Subjects:	Q Science > QC Physics
Series Name:	PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
Journal or Publication Title:	OPTICS, ILLUMINATION, AND IMAGE SENSING FOR MACHINE VISION VIII
Publisher:	SPIE - INT SOC OPTICAL ENGINEERING
ISBN:	0-8194-1330-5
Editor:	Svetkoff, DJ
Date:	1994
Volume:	2065
Number of Pages:	10
Page Range:	pp. 134-143
Publication Status:	Published
Title of Event:	Conference on Optics, Illumination, and Image Sensing for Machine Vision VIII
Location of Event:	BOSTON, MA
Date(s) of Event:	SEP 08-09, 1993
URI:	http://wrap.warwick.ac.uk/id/eprint/20466

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