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FOURIER-ANALYSIS OF COMPLEX FILTERING IN THE TRANSFORM PLANE FOR OBTAINING NANOMETRIC SURFACES PROFILES

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UNSPECIFIED (1994) FOURIER-ANALYSIS OF COMPLEX FILTERING IN THE TRANSFORM PLANE FOR OBTAINING NANOMETRIC SURFACES PROFILES. In: Conference on Optics, Illumination, and Image Sensing for Machine Vision VIII, BOSTON, MA, SEP 08-09, 1993. Published in: OPTICS, ILLUMINATION, AND IMAGE SENSING FOR MACHINE VISION VIII, 2065 pp. 134-143.

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Item Type: Conference Item (UNSPECIFIED)
Subjects: Q Science > QC Physics
Series Name: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
Journal or Publication Title: OPTICS, ILLUMINATION, AND IMAGE SENSING FOR MACHINE VISION VIII
Publisher: SPIE - INT SOC OPTICAL ENGINEERING
ISBN: 0-8194-1330-5
Editor: Svetkoff, DJ
Date: 1994
Volume: 2065
Number of Pages: 10
Page Range: pp. 134-143
Publication Status: Published
Title of Event: Conference on Optics, Illumination, and Image Sensing for Machine Vision VIII
Location of Event: BOSTON, MA
Date(s) of Event: SEP 08-09, 1993
URI: http://wrap.warwick.ac.uk/id/eprint/20466

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