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MICROSTRUCTURE, FLUX-PINNING AND CRITICAL-CURRENT DENSITY IN YBA2CU3O7-DELTA FILMS GROWN BY LASER-ABLATION

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UNSPECIFIED (1994) MICROSTRUCTURE, FLUX-PINNING AND CRITICAL-CURRENT DENSITY IN YBA2CU3O7-DELTA FILMS GROWN BY LASER-ABLATION. THIN SOLID FILMS, 245 (1-2). pp. 186-190.

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Abstract

Thin films of YBa2Cu3O7-delta (YBCO) are deposited by laser ablation at substrate temperatures (T(s)) ranging from 575 to 850-degrees-C. The microstructure and growth behaviour of the films are found to be a sensitive function of T(s). We also find that the critical current density (J(c)) of the films is strongly related to the microstructure. It is proposed that the boundaries between a-axis and c-axis grains may act as pinning centres.

Item Type: Journal Article
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Q Science > QC Physics
Journal or Publication Title: THIN SOLID FILMS
Publisher: ELSEVIER SCIENCE SA LAUSANNE
ISSN: 0040-6090
Official Date: 1 June 1994
Dates:
DateEvent
1 June 1994UNSPECIFIED
Volume: 245
Number: 1-2
Number of Pages: 5
Page Range: pp. 186-190
Publication Status: Published

Data sourced from Thomson Reuters' Web of Knowledge

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