MICROSTRUCTURE, FLUX-PINNING AND CRITICAL-CURRENT DENSITY IN YBA2CU3O7-DELTA FILMS GROWN BY LASER-ABLATION
UNSPECIFIED (1994) MICROSTRUCTURE, FLUX-PINNING AND CRITICAL-CURRENT DENSITY IN YBA2CU3O7-DELTA FILMS GROWN BY LASER-ABLATION. THIN SOLID FILMS, 245 (1-2). pp. 186-190. ISSN 0040-6090Full text not available from this repository.
Thin films of YBa2Cu3O7-delta (YBCO) are deposited by laser ablation at substrate temperatures (T(s)) ranging from 575 to 850-degrees-C. The microstructure and growth behaviour of the films are found to be a sensitive function of T(s). We also find that the critical current density (J(c)) of the films is strongly related to the microstructure. It is proposed that the boundaries between a-axis and c-axis grains may act as pinning centres.
|Item Type:||Journal Article|
|Subjects:||T Technology > TA Engineering (General). Civil engineering (General)
Q Science > QC Physics
|Journal or Publication Title:||THIN SOLID FILMS|
|Publisher:||ELSEVIER SCIENCE SA LAUSANNE|
|Date:||1 June 1994|
|Number of Pages:||5|
|Page Range:||pp. 186-190|
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