RELAXATION AND THERMAL HYSTERESIS IN THE ELECTRICAL-RESISTIVITY OF (ND1.6SR0.4)NIO4+DELTA COMPOUNDS
UNSPECIFIED (1993) RELAXATION AND THERMAL HYSTERESIS IN THE ELECTRICAL-RESISTIVITY OF (ND1.6SR0.4)NIO4+DELTA COMPOUNDS. PHYSICA B-CONDENSED MATTER, 192 (4). pp. 358-364. ISSN 0921-4526Full text not available from this repository.
We have measured the electrical resistivity from 10-300 K of two nominally identical samples of (Nd1.6Sr0.4)NiO4+delta. Both samples display clear semiconductor-like behaviour down to approximately 70 K. Below there are a series of transitional effects associated with metallic and magnetic behaviour. Since both samples are in the critical range where the tetragonal structure is being stabilised the behaviour is sample dependent. It is shown that both magnetic and structural effects influence the thermal hysteresis present in the electrical resistivity below 70 K.
|Item Type:||Journal Article|
|Subjects:||Q Science > QC Physics|
|Journal or Publication Title:||PHYSICA B-CONDENSED MATTER|
|Publisher:||ELSEVIER SCIENCE BV|
|Number of Pages:||7|
|Page Range:||pp. 358-364|
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