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X-RAY-DIFFRACTION CHARACTERIZATION OF SB DELTA DOPING IN SI
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UNSPECIFIED (1990) X-RAY-DIFFRACTION CHARACTERIZATION OF SB DELTA DOPING IN SI. [Journal Item]
Full text not available from this repository.| Item Type: | Journal Item |
|---|---|
| Subjects: | Q Science > QC Physics |
| Journal or Publication Title: | JOURNAL OF PHYSICS D-APPLIED PHYSICS |
| Publisher: | IOP PUBLISHING LTD |
| ISSN: | 0022-3727 |
| Date: | 14 December 1990 |
| Volume: | 23 |
| Number: | 12 |
| Number of Pages: | 3 |
| Page Range: | pp. 1745-1747 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/22953 |
Data sourced from Thomson Reuters' Web of Knowledge
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