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SUBNANOMETER TRANSDUCER CHARACTERIZATION BY X-RAY INTERFEROMETRY
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UNSPECIFIED (1990) SUBNANOMETER TRANSDUCER CHARACTERIZATION BY X-RAY INTERFEROMETRY. PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 12 (3). pp. 165-171. ISSN 0141-6359.
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| Item Type: | Journal Article | ||||
|---|---|---|---|---|---|
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) T Technology > TS Manufactures T Technology |
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| Journal or Publication Title: | PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING | ||||
| Publisher: | BUTTERWORTH-HEINEMANN | ||||
| ISSN: | 0141-6359 | ||||
| Official Date: | July 1990 | ||||
| Dates: |
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| Volume: | 12 | ||||
| Number: | 3 | ||||
| Number of Pages: | 7 | ||||
| Page Range: | pp. 165-171 | ||||
| Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
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