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UNSPECIFIED (1990) SUBNANOMETER TRANSDUCER CHARACTERIZATION BY X-RAY INTERFEROMETRY. PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 12 (3). pp. 165-171. ISSN 0141-6359
Full text not available from this repository.| Item Type: | Journal Article |
|---|---|
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) T Technology > TS Manufactures T Technology |
| Journal or Publication Title: | PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING |
| Publisher: | BUTTERWORTH-HEINEMANN |
| ISSN: | 0141-6359 |
| Date: | July 1990 |
| Volume: | 12 |
| Number: | 3 |
| Number of Pages: | 7 |
| Page Range: | pp. 165-171 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/23195 |
Data sourced from Thomson Reuters' Web of Knowledge
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