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SUB-NANOMETER DISPLACEMENTS CALIBRATION USING X-RAY INTERFEROMETRY
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UNSPECIFIED (1990) SUB-NANOMETER DISPLACEMENTS CALIBRATION USING X-RAY INTERFEROMETRY. MEASUREMENT SCIENCE & TECHNOLOGY, 1 (2). pp. 107-119. ISSN 0957-0233
Full text not available from this repository.| Item Type: | Journal Article |
|---|---|
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
| Journal or Publication Title: | MEASUREMENT SCIENCE & TECHNOLOGY |
| Publisher: | IOP PUBLISHING LTD |
| ISSN: | 0957-0233 |
| Date: | February 1990 |
| Volume: | 1 |
| Number: | 2 |
| Number of Pages: | 13 |
| Page Range: | pp. 107-119 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/23411 |
Data sourced from Thomson Reuters' Web of Knowledge
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