UNSPECIFIED (1989) RIPPLED SURFACE-TOPOGRAPHY OBSERVED ON SILICON MOLECULAR-BEAM EPITAXIAL AND VAPOR-PHASE EPITAXIAL LAYERS. In: 3RD INTERNATIONAL SYMP OF THE 1989 CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : SILICON MOLECULAR BEAM EPITAXY, STRASBOURG, FRANCE, MAY 30-JUN 02, 1989. Published in: THIN SOLID FILMS, 183 pp. 255-262.

Full text not available from this repository.

Item Type:	Conference Item (UNSPECIFIED)
Subjects:	T Technology > TA Engineering (General). Civil engineering (General) Q Science > QC Physics
Journal or Publication Title:	THIN SOLID FILMS
Publisher:	ELSEVIER SCIENCE SA LAUSANNE
ISSN:	0040-6090
Date:	30 December 1989
Volume:	183
Number of Pages:	8
Page Range:	pp. 255-262
Publication Status:	Published
Title of Event:	3RD INTERNATIONAL SYMP OF THE 1989 CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : SILICON MOLECULAR BEAM EPITAXY
Location of Event:	STRASBOURG, FRANCE
Date(s) of Event:	MAY 30-JUN 02, 1989
URI:	http://wrap.warwick.ac.uk/id/eprint/23450

Data sourced from Thomson Reuters' Web of Knowledge

Request changes to a record

Actions (login required)

View Item