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RIPPLED SURFACE-TOPOGRAPHY OBSERVED ON SILICON MOLECULAR-BEAM EPITAXIAL AND VAPOR-PHASE EPITAXIAL LAYERS
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UNSPECIFIED (1989) RIPPLED SURFACE-TOPOGRAPHY OBSERVED ON SILICON MOLECULAR-BEAM EPITAXIAL AND VAPOR-PHASE EPITAXIAL LAYERS. In: 3RD INTERNATIONAL SYMP OF THE 1989 CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : SILICON MOLECULAR BEAM EPITAXY, STRASBOURG, FRANCE, MAY 30-JUN 02, 1989. Published in: THIN SOLID FILMS, 183 pp. 255-262. ISSN 0040-6090.
Research output not available from this repository, contact author.| Item Type: | Conference Item (UNSPECIFIED) | ||||
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| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) Q Science > QC Physics |
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| Journal or Publication Title: | THIN SOLID FILMS | ||||
| Publisher: | ELSEVIER SCIENCE SA LAUSANNE | ||||
| ISSN: | 0040-6090 | ||||
| Official Date: | 30 December 1989 | ||||
| Dates: |
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| Volume: | 183 | ||||
| Number of Pages: | 8 | ||||
| Page Range: | pp. 255-262 | ||||
| Publication Status: | Published | ||||
| Title of Event: | 3RD INTERNATIONAL SYMP OF THE 1989 CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : SILICON MOLECULAR BEAM EPITAXY | ||||
| Location of Event: | STRASBOURG, FRANCE | ||||
| Date(s) of Event: | MAY 30-JUN 02, 1989 |
Data sourced from Thomson Reuters' Web of Knowledge
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