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RIPPLED SURFACE-TOPOGRAPHY OBSERVED ON SILICON MOLECULAR-BEAM EPITAXIAL AND VAPOR-PHASE EPITAXIAL LAYERS

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UNSPECIFIED (1989) RIPPLED SURFACE-TOPOGRAPHY OBSERVED ON SILICON MOLECULAR-BEAM EPITAXIAL AND VAPOR-PHASE EPITAXIAL LAYERS. In: 3RD INTERNATIONAL SYMP OF THE 1989 CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : SILICON MOLECULAR BEAM EPITAXY, STRASBOURG, FRANCE, MAY 30-JUN 02, 1989. Published in: THIN SOLID FILMS, 183 pp. 255-262. ISSN 0040-6090.

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Item Type: Conference Item (UNSPECIFIED)
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Q Science > QC Physics
Journal or Publication Title: THIN SOLID FILMS
Publisher: ELSEVIER SCIENCE SA LAUSANNE
ISSN: 0040-6090
Official Date: 30 December 1989
Dates:
DateEvent
30 December 1989UNSPECIFIED
Volume: 183
Number of Pages: 8
Page Range: pp. 255-262
Publication Status: Published
Title of Event: 3RD INTERNATIONAL SYMP OF THE 1989 CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : SILICON MOLECULAR BEAM EPITAXY
Location of Event: STRASBOURG, FRANCE
Date(s) of Event: MAY 30-JUN 02, 1989

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