The Library
RIPPLED SURFACE-TOPOGRAPHY OBSERVED ON SILICON MOLECULAR-BEAM EPITAXIAL AND VAPOR-PHASE EPITAXIAL LAYERS
Tools
Tools
Tools
UNSPECIFIED (1989) RIPPLED SURFACE-TOPOGRAPHY OBSERVED ON SILICON MOLECULAR-BEAM EPITAXIAL AND VAPOR-PHASE EPITAXIAL LAYERS. In: 3RD INTERNATIONAL SYMP OF THE 1989 CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : SILICON MOLECULAR BEAM EPITAXY, STRASBOURG, FRANCE, MAY 30-JUN 02, 1989. Published in: THIN SOLID FILMS, 183 pp. 255-262.
Full text not available from this repository.| Item Type: | Conference Item (UNSPECIFIED) |
|---|---|
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) Q Science > QC Physics |
| Journal or Publication Title: | THIN SOLID FILMS |
| Publisher: | ELSEVIER SCIENCE SA LAUSANNE |
| ISSN: | 0040-6090 |
| Date: | 30 December 1989 |
| Volume: | 183 |
| Number of Pages: | 8 |
| Page Range: | pp. 255-262 |
| Publication Status: | Published |
| Title of Event: | 3RD INTERNATIONAL SYMP OF THE 1989 CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : SILICON MOLECULAR BEAM EPITAXY |
| Location of Event: | STRASBOURG, FRANCE |
| Date(s) of Event: | MAY 30-JUN 02, 1989 |
| URI: | http://wrap.warwick.ac.uk/id/eprint/23450 |
Data sourced from Thomson Reuters' Web of Knowledge
Actions (login required)
 |
View Item |
