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EMPIRICAL TIGHT-BINDING CLUSTER METHOD FOR SEMICONDUCTOR SURFACE-STRUCTURES
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UNSPECIFIED (1988) EMPIRICAL TIGHT-BINDING CLUSTER METHOD FOR SEMICONDUCTOR SURFACE-STRUCTURES. In: UNSPECIFIEDPERGAMON-ELSEVIER SCIENCE LTD.
Full text not available from this repository.| Item Type: | Conference Item (UNSPECIFIED) |
|---|---|
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) Q Science > QC Physics |
| Journal or Publication Title: | VACUUM |
| Publisher: | PERGAMON-ELSEVIER SCIENCE LTD |
| ISSN: | 0042-207X |
| Date: | 1988 |
| Volume: | 38 |
| Number: | 4-5 |
| Number of Pages: | 1 |
| Page Range: | p. 430 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/24280 |
Data sourced from Thomson Reuters' Web of Knowledge
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