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THE DEPTH RESOLUTION OF SECONDARY ION MASS SPECTROMETERS - A CRITICAL-EVALUATION
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UNSPECIFIED (1988) THE DEPTH RESOLUTION OF SECONDARY ION MASS SPECTROMETERS - A CRITICAL-EVALUATION. [Journal Item]
Full text not available from this repository.| Item Type: | Journal Item |
|---|---|
| Subjects: | Q Science > QH Natural history |
| Journal or Publication Title: | SCANNING MICROSCOPY |
| Publisher: | SCANNING MICROSCOPY INT |
| ISSN: | 0891-7035 |
| Date: | June 1988 |
| Volume: | 2 |
| Number: | 2 |
| Number of Pages: | 14 |
| Page Range: | pp. 639-652 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/24438 |
Data sourced from Thomson Reuters' Web of Knowledge
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