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A MODEL STUDY OF FIELD-DEPENDENT DYNAMICAL SCREENING DUE TO MOBILE ELECTRONS IN SUB-MICRON SEMICONDUCTOR-DEVICES
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UNSPECIFIED (1985) A MODEL STUDY OF FIELD-DEPENDENT DYNAMICAL SCREENING DUE TO MOBILE ELECTRONS IN SUB-MICRON SEMICONDUCTOR-DEVICES. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 18 (12). pp. 2507-2525. ISSN 0022-3719
Full text not available from this repository.| Item Type: | Journal Article |
|---|---|
| Subjects: | Q Science > QC Physics |
| Journal or Publication Title: | JOURNAL OF PHYSICS C-SOLID STATE PHYSICS |
| Publisher: | IOP PUBLISHING LTD |
| ISSN: | 0022-3719 |
| Date: | 1985 |
| Volume: | 18 |
| Number: | 12 |
| Number of Pages: | 19 |
| Page Range: | pp. 2507-2525 |
| Publication Status: | Published |
| URI: | http://wrap.warwick.ac.uk/id/eprint/26180 |
Data sourced from Thomson Reuters' Web of Knowledge
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