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A method for predicting IGBT junction temperature under transient condition
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Ahmed, M. M. R. and Putrus, G. A. (2008) A method for predicting IGBT junction temperature under transient condition. In: 34th Annual Conference of the IEEE-Industrial-Electronics-Society, Orlando, FL, Nov 10-13, 2008. Published in: Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE , Vol.1-5 pp. 403-408.
Full text not available from this repository.Abstract
In this paper, a method to predict junction temperature of the solid-state switch under transient condition is presented. The method is based on the thermal model of the switch and instantaneous measurement of the energy loss in the device. The method for deriving thermal model parameters from the manufacturers data sheet is derived and verified. A simulation work has been carried out on a single IGBT under different conditions using MATLAB/SIMULINK. The results show that the proposed method is effective to predict the junction temperature of the solid-state device during transient conditions and is applicable to other devices such as diodes and thyristors.
| Item Type: | Conference Item (UNSPECIFIED) |
|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Faculty of Science > Engineering |
| Library of Congress Subject Headings (LCSH): | Insulated gate bipolar transistors, Transients (Electricity) |
| Series Name: | IEEE Industrial Electronics Society |
| Journal or Publication Title: | Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE |
| Publisher: | IEEE |
| ISBN: | 978-1-4244-1767-4 |
| ISSN: | 1553-572X |
| Date: | 2008 |
| Volume: | Vol.1-5 |
| Number of Pages: | 6 |
| Page Range: | pp. 403-408 |
| Identification Number: | 10.1109/IECON.2008.4757996 |
| Status: | Not Peer Reviewed |
| Publication Status: | Published |
| Access rights to Published version: | Restricted or Subscription Access |
| Title of Event: | 34th Annual Conference of the IEEE-Industrial-Electronics-Society |
| Type of Event: | Conference |
| Location of Event: | Orlando, FL |
| Date(s) of Event: | Nov 10-13, 2008 |
| URI: | http://wrap.warwick.ac.uk/id/eprint/27920 |
Data sourced from Thomson Reuters' Web of Knowledge
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