Ahmed, M. M. R. and Mawby, P. A. (Philip A.) (2008) Analysis of parallel CoolMOS under saturation-mode operation. In: 34th Annual Conference of the IEEE-Industrial-Electronics-Society, Orlando, FL, Nov 10-13, 2008. Published in: IEEE Industrial Electronics Society. Annual Conference. Proceedings, Vol.1-5 pp. 500-504.

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Abstract

In this paper we study the parallel operation of power MOSFETs. Normally, being switches, they operate either in the cut-off region or in the linear region, thus acting as a switch. However, in some fault conditions it is necessary for the MOSFET to be used to limit the current, in which case the device may operate in the saturation region. The MOSFET can only operate in this region for a finite amount of time, as is limited by thermal considerations. Specifically in this paper we study lite parallel operation of CoolMOS devices using stat-of-the-art electrothermal models implemented in SABER. Tire simulation results reported in this paper offer a valuable insight into the parallel operation of super junction MOSFETs operating in the saturation-mode operation. By varying the properties of one of the MOSFETs in parallel, the effect on system thermal stability is explored and hence is used to enhance the reliability of such paralleled devices.

Item Type:	Conference Item (UNSPECIFIED)
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:	Faculty of Science > Engineering
Library of Congress Subject Headings (LCSH):	Metal oxide semiconductor field-effect transistors
Series Name:	IEEE Industrial Electronics Society
Journal or Publication Title:	IEEE Industrial Electronics Society. Annual Conference. Proceedings
Publisher:	IEEE
ISBN:	978-1-4244-1767-4
ISSN:	1553-572X
Official Date:	2008
Volume:	Vol.1-5
Number of Pages:	5
Page Range:	pp. 500-504
Identification Number:	10.1109/IECON.2008.4758013
Status:	Not Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Restricted or Subscription Access
Title of Event:	34th Annual Conference of the IEEE-Industrial-Electronics-Society
Type of Event:	Conference
Location of Event:	Orlando, FL
Date(s) of Event:	Nov 10-13, 2008
URI:	http://wrap.warwick.ac.uk/id/eprint/27921

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