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Similarity invariant Delaunay graph matching
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Shin, Dongjoe and Tjahjadi, Tardi (2008) Similarity invariant Delaunay graph matching. In: Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, University of Central Florida, Orlando, FL, U.S.A., Dec 04-16, 2008. Published in: Lecture Notes in Computer Science, Vol.5342/2008 pp. 25-34. ISBN 978-3-540-89688-3. ISSN 0302-9743. doi:10.1007/978-3-540-89689-0_7
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Official URL: http://dx.doi.org/10.1007/978-3-540-89689-0_7
Abstract
Delaunay tessellation describes a set of arbitrarily distributed points as unique triangular graphs which preserves most local point configuration called a clique regardless of noise addition and partial occlusion. In this paper, this structure is utilised in a matching method and proposed a clique-based Hausdorff Distance (HD) to address point pattern matching problems. Since the proposed distance exploits similarity invariant features extracted from a clique, it is invariant to rotation, translation and scaling. Furthermore, it inherits noise robustness from HD and has partial matching ability because matching performs on local entities. Experimental results show that the proposed method performs better than the existing variants of the general HD.
| Item Type: | Conference Item (Paper) | ||||
|---|---|---|---|---|---|
| Subjects: | Q Science > QA Mathematics > QA76 Electronic computers. Computer science. Computer software T Technology > TK Electrical engineering. Electronics Nuclear engineering |
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| Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||
| Series Name: | LECTURE NOTES IN COMPUTER SCIENCE | ||||
| Journal or Publication Title: | Lecture Notes in Computer Science | ||||
| Publisher: | Springer | ||||
| ISBN: | 978-3-540-89688-3 | ||||
| ISSN: | 0302-9743 | ||||
| Editor: | DaVitoria Lobo, N, and Kasparis, T and Roli, F and Kwok, JT and Georgiopoulos, M and Anagnostopoulos, GC and Loog, M | ||||
| Official Date: | 2008 | ||||
| Dates: |
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| Volume: | Vol.5342/2008 | ||||
| Number of Pages: | 10 | ||||
| Page Range: | pp. 25-34 | ||||
| DOI: | 10.1007/978-3-540-89689-0_7 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access | ||||
| Conference Paper Type: | Paper | ||||
| Title of Event: | Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition | ||||
| Type of Event: | Workshop | ||||
| Location of Event: | University of Central Florida, Orlando, FL, U.S.A. | ||||
| Date(s) of Event: | Dec 04-16, 2008 |
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