Shin, Dongjoe and Tjahjadi, Tardi (2008) Similarity invariant Delaunay graph matching. In: Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, University of Central Florida, Orlando, FL, U.S.A., Dec 04-16, 2008. Published in: Lecture Notes in Computer Science, Vol.5342/2008 pp. 25-34.

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Abstract

Delaunay tessellation describes a set of arbitrarily distributed points as unique triangular graphs which preserves most local point configuration called a clique regardless of noise addition and partial occlusion. In this paper, this structure is utilised in a matching method and proposed a clique-based Hausdorff Distance (HD) to address point pattern matching problems. Since the proposed distance exploits similarity invariant features extracted from a clique, it is invariant to rotation, translation and scaling. Furthermore, it inherits noise robustness from HD and has partial matching ability because matching performs on local entities. Experimental results show that the proposed method performs better than the existing variants of the general HD.

Item Type:	Conference Item (Paper)
Subjects:	Q Science > QA Mathematics > QA76 Electronic computers. Computer science. Computer software T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:	Faculty of Science > Engineering
Series Name:	LECTURE NOTES IN COMPUTER SCIENCE
Journal or Publication Title:	Lecture Notes in Computer Science
Publisher:	Springer
ISBN:	978-3-540-89688-3
ISSN:	0302-9743
Editor:	DaVitoria Lobo, N, and Kasparis, T and Roli, F and Kwok, JT and Georgiopoulos, M and Anagnostopoulos, GC and Loog, M
Official Date:	2008
Volume:	Vol.5342/2008
Number of Pages:	10
Page Range:	pp. 25-34
Identification Number:	10.1007/978-3-540-89689-0_7
Status:	Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Restricted or Subscription Access
Conference Paper Type:	Paper
Title of Event:	Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition
Type of Event:	Workshop
Location of Event:	University of Central Florida, Orlando, FL, U.S.A.
Date(s) of Event:	Dec 04-16, 2008
URI:	http://wrap.warwick.ac.uk/id/eprint/28432

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