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Design validation testing of vehicle instrument cluster using machine vision and hardware-in-the-loop
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Huang, Yingping, Mouzakitis, Alexandros, McMurran, Ross, Dhadyalla, Gunwant and Jones, P. (Peter), Dr. (2008) Design validation testing of vehicle instrument cluster using machine vision and hardware-in-the-loop. In: IEEE International Conference on Vehicular Electronics and Safety, Columbus, OH, Sep 22-24, 2008. Published in: Proceedings of 2008 IEEE International Conference on Vehicular Electronics and Safety, Volume 1 pp. 265-270. ISBN 978-1-4244-2359-0. doi:10.1109/ICVES.2008.4640857
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Official URL: http://dx.doi.org/10.1109/ICVES.2008.4640857
Abstract
This paper presents an advanced testing system, combining hardware-in-the-loop (HIL) and machine vision technologies, for automated design validation testing of a vehicle instrument cluster. In the system, a HIL set-up supported by model-based approaches simulates vehicle network in real-time, and provides all essential signals to the instrument cluster under test. The machine vision system with novel image processing algorithms is designed to perform function tests by detecting gauges, warning lights/tell-tales, patterns and text displays. The system developed greatly eases the task of tedious validation testing, and makes onerous repeated tests possible.
Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering T Technology > TA Engineering (General). Civil engineering (General) |
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Divisions: | Faculty of Science, Engineering and Medicine > Engineering > WMG (Formerly the Warwick Manufacturing Group) | ||||
Library of Congress Subject Headings (LCSH): | Automobiles -- Instruments -- Display systems -- Testing, Computer vision, Image processing -- Digital techniques | ||||
Journal or Publication Title: | Proceedings of 2008 IEEE International Conference on Vehicular Electronics and Safety | ||||
Publisher: | IEEE | ||||
ISBN: | 978-1-4244-2359-0 | ||||
Official Date: | 2008 | ||||
Dates: |
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Volume: | Volume 1 | ||||
Number of Pages: | 6 | ||||
Page Range: | pp. 265-270 | ||||
DOI: | 10.1109/ICVES.2008.4640857 | ||||
Status: | Not Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Funder: | Great Britain. Department of Trade and Industry (DTI) | ||||
Grant number: | TP/4/VCS/6/I/20027 (DTI) | ||||
Title of Event: | IEEE International Conference on Vehicular Electronics and Safety | ||||
Type of Event: | Conference | ||||
Location of Event: | Columbus, OH | ||||
Date(s) of Event: | Sep 22-24, 2008 |
Data sourced from Thomson Reuters' Web of Knowledge
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