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Design validation testing of vehicle instrument cluster using machine vision and hardware-in-the-loop

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Huang, Yingping, Mouzakitis, Alexandros, McMurran, Ross, Dhadyalla, Gunwant and Jones, P. (Peter), Dr. (2008) Design validation testing of vehicle instrument cluster using machine vision and hardware-in-the-loop. In: IEEE International Conference on Vehicular Electronics and Safety, Columbus, OH, Sep 22-24, 2008. Published in: Proceedings of 2008 IEEE International Conference on Vehicular Electronics and Safety, Volume 1 pp. 265-270. ISBN 978-1-4244-2359-0. doi:10.1109/ICVES.2008.4640857

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Official URL: http://dx.doi.org/10.1109/ICVES.2008.4640857

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Abstract

This paper presents an advanced testing system, combining hardware-in-the-loop (HIL) and machine vision technologies, for automated design validation testing of a vehicle instrument cluster. In the system, a HIL set-up supported by model-based approaches simulates vehicle network in real-time, and provides all essential signals to the instrument cluster under test. The machine vision system with novel image processing algorithms is designed to perform function tests by detecting gauges, warning lights/tell-tales, patterns and text displays. The system developed greatly eases the task of tedious validation testing, and makes onerous repeated tests possible.

Item Type: Conference Item (UNSPECIFIED)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
T Technology > TA Engineering (General). Civil engineering (General)
Divisions: Faculty of Science, Engineering and Medicine > Engineering > WMG (Formerly the Warwick Manufacturing Group)
Library of Congress Subject Headings (LCSH): Automobiles -- Instruments -- Display systems -- Testing, Computer vision, Image processing -- Digital techniques
Journal or Publication Title: Proceedings of 2008 IEEE International Conference on Vehicular Electronics and Safety
Publisher: IEEE
ISBN: 978-1-4244-2359-0
Official Date: 2008
Dates:
DateEvent
2008Published
Volume: Volume 1
Number of Pages: 6
Page Range: pp. 265-270
DOI: 10.1109/ICVES.2008.4640857
Status: Not Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
Funder: Great Britain. Department of Trade and Industry (DTI)
Grant number: TP/4/VCS/6/I/20027 (DTI)
Title of Event: IEEE International Conference on Vehicular Electronics and Safety
Type of Event: Conference
Location of Event: Columbus, OH
Date(s) of Event: Sep 22-24, 2008

Data sourced from Thomson Reuters' Web of Knowledge

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