Yim, S. and Jones, T. S. (Tim S.) (2009) Growth dynamics of C-60 thin films: effect of molecular structure. Applied Physics Letters, Vol.94 (No.2). Article no. 021911. doi:10.1063/1.3072805

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Abstract

The surface morphology and growth behavior of fullerene thin films have been studied by atomic force microscopy and height difference correlation function analysis. In contrast to the large growth exponents (beta) previously reported for other organic semiconductor thin-film materials, a relatively small beta value of 0.39 +/- 0.10 was determined. Simulations of (1+1)-dimensional surface lateral diffusion models indicate that the evolution of deep grain boundaries leads to a rapid increase in beta. We suggest that the commonly observed large beta values for organic thin films are due to their intrinsically anisotropic molecular structures and hence different stacking directions between crystallite domains.

Item Type:	Journal Article
Subjects:	Q Science > QC Physics
Divisions:	Faculty of Science > Chemistry
Journal or Publication Title:	Applied Physics Letters
Publisher:	American Institute of Physics
ISSN:	0003-6951
Official Date:	12 January 2009
Dates:	Date Event 12 January 2009 Published
Volume:	Vol.94
Number:	No.2
Number of Pages:	3
Page Range:	Article no. 021911
DOI:	10.1063/1.3072805
Status:	Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Restricted or Subscription Access
Funder:	Korean Government (MOEHR), Kookmin University in Korea
Grant number:	KRF-2008-331C00138

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