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X-ray diffraction study of gold nitride films: Observation of a solid solution phase

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Alves, L., Hase, Thomas P. A., Hunt, M. R. C., Brieva, A. C. and Siller, L. (2008) X-ray diffraction study of gold nitride films: Observation of a solid solution phase. Journal of Applied Physics, Vol.104 (No.11). article no. 113527. doi:10.1063/1.3040717 ISSN 0021-8979.

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Official URL: http://dx.doi.org/10.1063/1.3040717

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Abstract

The structure of nitride containing gold films produced by reactive ion sputtering and nitrogen plasma etching is investigated using x-ray photoelectron spectroscopy and x-ray diffraction. It is found that gold nitride is a solid solution of nitrogen atoms dissolved in a fcc gold matrix. Differences between the strain and lattice parameters of gold and gold nitride films were observed and are explained by interstitial nitrogen present in the latter. c 2008 American Institute of Physics. [DOI: 10.1063/1.3040717]

Item Type: Journal Article
Subjects: Q Science > QC Physics
Q Science > QD Chemistry
Divisions: Faculty of Science, Engineering and Medicine > Science > Physics
Library of Congress Subject Headings (LCSH): X-rays -- Diffraction, Gold films, Solutions, Solid, Nitrides
Journal or Publication Title: Journal of Applied Physics
Publisher: American Institute of Physics
ISSN: 0021-8979
Official Date: 1 December 2008
Dates:
DateEvent
1 December 2008Published
Volume: Vol.104
Number: No.11
Number of Pages: 5
Page Range: article no. 113527
DOI: 10.1063/1.3040717
Status: Peer Reviewed
Publication Status: Published
Funder: Engineering and Physical Sciences Research Council (EPSRC)
Grant number: EP/C006011/1 (EPSRC)

Data sourced from Thomson Reuters' Web of Knowledge

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