Alves, L., Hase, Thomas P. A., Hunt, M. R. C., Brieva, A. C. and Siller, L.. (2008) X-ray diffraction study of gold nitride films: Observation of a solid solution phase. Journal of Applied Physics, Vol.104 (No.11). article no. 113527. ISSN 0021-8979

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Abstract

The structure of nitride containing gold films produced by reactive ion sputtering and nitrogen plasma etching is investigated using x-ray photoelectron spectroscopy and x-ray diffraction. It is found that gold nitride is a solid solution of nitrogen atoms dissolved in a fcc gold matrix. Differences between the strain and lattice parameters of gold and gold nitride films were observed and are explained by interstitial nitrogen present in the latter. c 2008 American Institute of Physics. [DOI: 10.1063/1.3040717]

Item Type:	Journal Article
Subjects:	Q Science > QC Physics Q Science > QD Chemistry
Divisions:	Faculty of Science > Physics
Library of Congress Subject Headings (LCSH):	X-rays -- Diffraction, Gold films, Solutions, Solid, Nitrides
Journal or Publication Title:	Journal of Applied Physics
Publisher:	American Institute of Physics
ISSN:	0021-8979
Official Date:	1 December 2008
Dates:	Date Event 1 December 2008 Published
Volume:	Vol.104
Number:	No.11
Number of Pages:	5
Page Range:	article no. 113527
Identification Number:	10.1063/1.3040717
Status:	Peer Reviewed
Publication Status:	Published
Funder:	Engineering and Physical Sciences Research Council (EPSRC)
Grant number:	EP/C006011/1 (EPSRC)
URI:	http://wrap.warwick.ac.uk/id/eprint/28715

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