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Surface electron accumulation and the charge neutrality level in In2O3
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King, P. D. C., Veal, T. D. (Tim D.), Payne, D. J., Bourlange, A., Egdell, R. G. and McConville, C. F. (Chris F.) (2008) Surface electron accumulation and the charge neutrality level in In2O3. Physical Review Letters, Vol.101 (No.11). Article no. 116808. doi:10.1103/PhysRevLett.101.116808 ISSN 0031-9007.
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Official URL: http://dx.doi.org/10.1103/PhysRevLett.101.116808
Abstract
High-resolution x-ray photoemission spectroscopy, infrared reflectivity and Hall effect measurements, combined with surface space-charge calculations, are used to show that electron accumulation occurs at the surface of undoped single-crystalline In2O3. From a combination of measurements performed on undoped and heavily Sn-doped samples, the charge neutrality level is shown to lie similar to 0.4 eV above the conduction band minimum in In2O3, explaining the electron accumulation at the surface of undoped material, the propensity for n-type conductivity, and the ease of n-type doping in In2O3, and hence its use as a transparent conducting oxide material.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QC Physics | ||||
Divisions: | Faculty of Science, Engineering and Medicine > Science > Physics | ||||
Library of Congress Subject Headings (LCSH): | Electrons, Surfaces (Physics), Transparent semiconductors, Metal oxide semiconductors, Oxides -- Electric properties, Electronic structure | ||||
Journal or Publication Title: | Physical Review Letters | ||||
Publisher: | American Physical Society | ||||
ISSN: | 0031-9007 | ||||
Official Date: | 12 September 2008 | ||||
Dates: |
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Volume: | Vol.101 | ||||
Number: | No.11 | ||||
Number of Pages: | 4 | ||||
Page Range: | Article no. 116808 | ||||
DOI: | 10.1103/PhysRevLett.101.116808 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Funder: | Engineering and Physical Sciences Research Council (EPSRC) | ||||
Grant number: | EP/C535553/1 (EPSRC), GR/S94148 (EPSRC), EP/E025722/1 (EPSRC) |
Data sourced from Thomson Reuters' Web of Knowledge
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