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Surface electronic properties of n- and p-type InGaN alloys

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King, P. D. C., Veal, T. D., Lu, H., Jefferson, Paul Harvey, Hatfield, S. A., Schaff, William Joseph and McConville, C. F. (2008) Surface electronic properties of n- and p-type InGaN alloys. Physica Status Solidi. B: Basic Research, Vol.245 (No.5). pp. 881-883. doi:10.1002/pssb.200778452 ISSN 0370-1972.

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Official URL: http://dx.doi.org/10.1002/pssb.200778452

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Abstract

X-ray photoemission spectroscopy is utilised to determine the variation in surface Fermi level pinning across the composition range of n- and p-type c-plane InxGa1-xN alloys. The pinning relative to the charge neutrality level is used to explain a change in band bending direction causing a transition from surface electron accumulation (In rich) to depletion (Ga-rich), at x approximate to 0.43 for n-type alloys and a transition from surface inversion to hole depletion at x approximate to 0.59 for p-type alloys where downward band bending occurs across the composition range. (C) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Item Type: Journal Article
Subjects: Q Science > QC Physics
Divisions: Faculty of Science, Engineering and Medicine > Science > Physics
Library of Congress Subject Headings (LCSH): Alloys -- Electric properties, Surfaces (Technology)
Journal or Publication Title: Physica Status Solidi. B: Basic Research
Publisher: Wiley - V C H Verlag GmbH & Co.
ISSN: 0370-1972
Official Date: May 2008
Dates:
DateEvent
May 2008Published
Volume: Vol.245
Number: No.5
Number of Pages: 3
Page Range: pp. 881-883
DOI: 10.1002/pssb.200778452
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
Funder: Engineering and Physical Sciences Research Council (EPSRC)
Grant number: EP/C535553/1 (EPSRC), GR/S14252/01 (EPSRC)
Version or Related Resource: Presented at 7th International Conference on Nitride Semiconductors (ICNS-7), Las Vegas, NV, Sep 16-21, 2007
Conference Paper Type: Other
Type of Event: Conference

Data sourced from Thomson Reuters' Web of Knowledge

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