| References: |
[1] D. Segev, C.G. Van de Walle, Surf. Sci. 601 (2007) L15.
[2] T.D. Veal, P.D.C. King, P.H. Jefferson, L.F.J. Piper, C.F. McConville,
H. Lu, W.J. Schaff, P.A. Anderson, S.M. Durbin, D. Muto, H.
Naoi, Y. Nanishi, Phys. Rev. B 76 (2007) 075313.
[3] T.D. Veal, P.D.C. King, M. Walker, C.F. McConville, H. Lu, W.J.
Schaff, Physica B 401–402 (2007) 351.
[4] D. Muto, T. Araki, H. Naoi, F. Matsuda, Y. Nanishi, Phys. Stat. Sol.
A 202 (2005) 773.
[5] D. Segev, C.G. Van de Walle, Europhys. Lett. 76 (2006) 305.
[6] C.G. Van de Walle, D. Segev, J. Appl. Phys. 101 (2007) 081704.
[7] H. Lu, W.J. Schaff, L.F. Eastman, C.E. Stutz, Appl. Phys. Lett. 82
(2003) 1736.
[8] I. Mahboob, T.D. Veal, C.F. McConville, H. Lu, W.J. Schaff, Phys.
Rev. Lett. 92 (2004) 036804.
[9] L.F.J. Piper, T.D. Veal, P.H. Jefferson, C.F. McConville, F. Fuchs, J.
Furthmu¨ ller, F. Bechstedt, H. Lu, W.J. Schaff, Phys. Rev. B 72 (2005)
245319.
[10] P.D.C. King, T.D. Veal, C.F. McConville, F. Fuchs, J. Furthmu¨ ller,
F. Bechstedt, P. Schley, R. Goldhahm, J. Scho¨rmann, D.J. As, K.
Lischka, D. Muto, H. Naoi, H. Lu, W.J. Schaff, Appl. Phys. Lett. 91
(2007) 092101.
[11] C.F. Shih, N.C. Chen, P.H. Chang, K.S. Liu, Jpn. J. Appl. Phys. -
Part 1 44 (2005) 7892.
[12] P.D.C. King, T.D. Veal, P.H. Jefferson, C.F. McConville, T. Wang,
P.J. Parbrook, H. Lu, W.J. Schaff, Appl. Phys. Lett. 90 (2007) 132105.
[13] V. Lebedev, C.Y. Wang, V. Cimalla, S. Hauguth, T. Kups, M. Ali, G.
Ecke, M. Himmerlich, S. Krischok, J.A. Schaefer, O. Ambacher,
V.M. Polyakov, F. Schwierz, J. Appl. Phys. 101 (2007) 123705.
[14] I. Lee, C. Yu, H.-J. Shin, J.-Y. Kim, Y. Lee, T.-B. Hur, H.-K. Kim,
Thin Solid Films 515 (2007) 4691.
[15] I.J. Lee, J.Y. Kim, H.J. Shin, H.K. Kim, J. Appl. Phys. 95 (2004)
5540.
[16] K.S.A. Butcher, A.J. Fernandes, P.P.-T. Chen, M. Wintrebert-
Fouquet, H. Timmers, S.K. Shrestha, H. Hirshy, R.M. Perks, B.F.
Usher, J. Appl. Phys. 101 (2007) 123702.
[17] M. Himmerlich, S. Krischok, V. Lebedev, O. Ambacher, J. Schaefer,
J. Cryst. Growth 306 (2007) 6.
[18] D.P. Woodruff, T.A. Delchar, Modern Techniques of Surface
Science, second ed., Cambridge University Press, Cambridge, 1994.
[19] R.G. Egdell, T.J. Walker, G. Beamson, J. Electron Spectrosc. Relat.
Phenom. 128 (2003) 59.
[20] R.G. Egdell, J. Rebane, T.J. Walker, D.S.L. Law, Phys. Rev. B 59
(1999) 1792.
[21] V. Christou, M. Etchells, O. Renault, P.J. Dobson, O.V. Salata, G.
Beamson, R.G. Egdell, J. Appl. Phys. 88 (2000) 5180.
[22] D. Payne, R. Egdell, W. Hao, J. Foord, A. Walsh, G. Watson, Chem.
Phys. Lett. 411 (2005) 181.
[23] W.J. Schaff, H. Lu, L.F. Eastman, W. Walukiewicz, K.M. Yu, S.
Keller, S. Kurtz, B. Keyes, L. Gevilas, Electrical properties of InN
grown by Molecular Beam Epitaxy, in: H.M. Ng, A.G. Baca (Eds.),
State-of-the-Art Program on Compound Semiconductors XLI and
Nitride and Wide Bandgap Semiconductors for Sensors, Photonics,
and Electronics V, vol. 2004–06 of The Electrochemical Society
Proceedings Series, Honolulu, Hawaii, 3–8 October 2004, Electrochemical
Society, Pennington, NJ, 2004, pp. 358–371.
[24] W. Walukiewicz, J.W. Ager III, K.M. Yu, Z. Liliental-Weber, J. Wu,
S.X. Li, R.E. Jones, J.D. Denlinger, J. Phys. D: Appl. Phys. 39 (2006)
R83.
[25] L.F.J. Piper, T.D. Veal, M. Walker, I. Mahboob, C.F. McConville,
H. Lu, W.J. Schaff, J. Vac. Sci. Technol. A 23 (2005) 617.
[26] S.A. Chambers, T. Droubay, T.C. Kaspar, M. Gutowski, J. Vac. Sci.
Technol. B 22 (2004) 2205.
[27] C. Persson, A. Zunger, Phys. Rev. B 68 (2003) 073205.
[28] T.D. Veal, L.F.J. Piper, W.J. Schaff, C.F. McConville, J. Cryst.
Growth 288 (2006) 268.
[29] I. Mahboob, T.D. Veal, L.F.J. Piper, C.F. McConville, H. Lu, W.J.
Schaff, J. Furthmu¨ ller, F. Bechstedt, Phys. Rev. B 69 (2004)
201307(R).
[30] J.A. Rodriguez, T. Jirsak, S. Sambasivan, D. Fischer, A. Maiti, J.
Chem. Phys. 112 (2000) 9929.
[31] J.-D. Hecht, F. Frost, A. Sidorenko, D. Hirsch, H. Neumann, A.
Schindler, S. Krasnikow, L. Zhang, T. Chasse´, Solid-State Electron.
47 (2003) 413.
[32] T.D. Veal, I. Mahboob, C.F. McConville, T.M. Burke, T. Ashley,
Appl. Phys. Lett. 83 (2003) 1776.
[33] J.-D. Hecht, F. Frost, T. Chasse´, D. Hirsch, H. Neumann, A.
Schindler, F. Bigl, Appl. Surf. Sci. 179 (2001) 196.
[34] J.-D. Hecht, F. Frost, D. Hirsch, H. Neumann, A. Schindler, A.B.
Preobrajenski, T. Chasse´, J. Appl. Phys. 90 (2001) 6066.
[35] R.I. Hegde, P.J. Tobin, K.G. Reid, B. Maiti, S.A. Ajuria, Appl. Phys.
Lett. 66 (1995) 2882. |
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