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Comparison of LiNbO3 flux systems for deposition on RIE-etched LiTaO3 substrates

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Marshall, Jessica M., Walker, David, Thomas, Pam A., Dobedoe, R. S., Ren, Z. and Yu, S. (2007) Comparison of LiNbO3 flux systems for deposition on RIE-etched LiTaO3 substrates. Journal of Physics D: Applied Physics, 40 (23). pp. 7480-7484. doi:10.1088/0022-3727/40/23/034 ISSN 0022-3727.

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Official URL: http://dx.doi.org/10.1088/0022-3727/40/23/034

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Abstract

Single-crystal LiNbO3 films were deposited by liquid phase epitaxy (LPE) onto inductively coupled plasma-assisted reactive ion etched (RIE) LiTaO3 substrates. The RIE-etched channels were 6 mu m wide by 0.9 mu m deep. Surface roughness at the bottom of trenches was 100 nm or better with sidewall roughness below detection limits. This study also compares the suitability of the LiBO2 - LiNbO3 and the LiVO3 - LiNbO3 flux systems. From high-resolution x-ray diffraction and scanning electron microscopy (SEM) data, LiBO2 - LiNbO3 was determined to be the superior flux system with respect to diffraction profile widths of the 0 0 12 reflection. Films grown from boron-based flux were observed to have narrower x-ray rocking curve widths than films grown from vanadium-based flux, with typical values of the FWHM of 0.018 degrees and 0.041 degrees, respectively. Boron-based LPE was then used to deposit LiNbO3 film onto (RIE) LiTaO3 substrates. SEM imaging and energy dispersive x-ray analysis showed a sharp composition change between film and substrate indicative of a step index change suitable for waveguiding.

Item Type: Journal Article
Subjects: Q Science > QC Physics
Divisions: Faculty of Science, Engineering and Medicine > Science > Physics
Journal or Publication Title: Journal of Physics D: Applied Physics
Publisher: IOP Publishing
ISSN: 0022-3727
Official Date: 16 November 2007
Dates:
DateEvent
16 November 2007Published
Volume: 40
Number: 23
Number of Pages: 5
Page Range: pp. 7480-7484
DOI: 10.1088/0022-3727/40/23/034
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access

Data sourced from Thomson Reuters' Web of Knowledge

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