Skip to content Skip to navigation
University of Warwick
  • Study
  • |
  • Research
  • |
  • Business
  • |
  • Alumni
  • |
  • News
  • |
  • About

University of Warwick
Publications service & WRAP

Highlight your research

  • WRAP
    • Home
    • Search WRAP
    • Browse by Warwick Author
    • Browse WRAP by Year
    • Browse WRAP by Subject
    • Browse WRAP by Department
    • Browse WRAP by Funder
    • Browse Theses by Department
  • Publications Service
    • Home
    • Search Publications Service
    • Browse by Warwick Author
    • Browse Publications service by Year
    • Browse Publications service by Subject
    • Browse Publications service by Department
    • Browse Publications service by Funder
  • Statistics
  • Help & Advice
University of Warwick

The Library

  • Login

Is there life after bit error rate or before ?

Tools
- Tools
+ Tools

Lawrance, Anthony J. (2006) Is there life after bit error rate or before ? In: IEEE International Symposium on Circuits and Systems, Kos Isl, GREECE, MAY 21-24, 2006. Published in: 2006 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-11, PROCEEDINGS pp. 185-188.

Full text not available from this repository.

Abstract

This paper considers some little discussed basic aspects of bit error probability and bit error rate in the context of spread spectrum shift keying binary communication systems. It points out that bit error rate is an average of bit error probability and suggests further ways of using the distribution of bit error probability to give alternative and complementary measures of performance of binary communication systems. One of these is a probability interval measure and two others capture the idea of outage. Illustrations are given using the extremes of spreading choices, namely independent Gaussian random variables and chaotic dependent random variables.

Item Type: Conference Item (UNSPECIFIED)
Subjects: Q Science > QA Mathematics > QA76 Electronic computers. Computer science. Computer software
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Series Name: IEEE INTERNATIONAL SYMP ON CIRCUITS AND SYSTEMS
Journal or Publication Title: 2006 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-11, PROCEEDINGS
Publisher: IEEE
ISBN: 978-0-7803-9389-9
ISSN: 0277-674X
Date: 2006
Number of Pages: 4
Page Range: pp. 185-188
Publication Status: Published
Title of Event: IEEE International Symposium on Circuits and Systems
Location of Event: Kos Isl, GREECE
Date(s) of Event: MAY 21-24, 2006
URI: http://wrap.warwick.ac.uk/id/eprint/31040

Data sourced from Thomson Reuters' Web of Knowledge

Request changes to a record

Actions (login required)

View Item View Item
twitter

Email us: publications@warwick.ac.uk
Contact Details
About Us