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Spatial determination of gold catalyst residue used in the production of ZnO nanowires by SIMS depth profiling analysis
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Morris, R. J. H. (Richard J. H.), Dowsett, M. G., Dalal, S. H., Baptista, D. L., Teo, K. B. K. and Milne, W. I. (2007) Spatial determination of gold catalyst residue used in the production of ZnO nanowires by SIMS depth profiling analysis. Surface and Interface Analysis, Vol.39 (No.11). pp. 898-901. doi:10.1002/sia.2610 ISSN 0142-2421.
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Official URL: http://dx.doi.org/10.1002/sia.2610
Abstract
In this paper we demonstrate how secondary ion mass spectrometry (SIMS) can be applied to ZnO nanowire structures for gold catalyst residue determination. Gold plays a significant role in determining the structural properties of such nanowires, with the location of the gold after growth being a strong indicator of the growth mechanism. For the material investigated here, we find that the gold remains at the substrate-nanowire interface. This was not anticipated as the usual growth mechanism associated with catalyst growth is of a vapour-liquid-solid (VLS) type. The results presented here favour a vapour-solid (VS) growth mechanism instead.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QD Chemistry | ||||
Divisions: | Faculty of Science, Engineering and Medicine > Science > Physics | ||||
Journal or Publication Title: | Surface and Interface Analysis | ||||
Publisher: | John Wiley & Sons Ltd. | ||||
ISSN: | 0142-2421 | ||||
Official Date: | November 2007 | ||||
Dates: |
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Volume: | Vol.39 | ||||
Number: | No.11 | ||||
Number of Pages: | 4 | ||||
Page Range: | pp. 898-901 | ||||
DOI: | 10.1002/sia.2610 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access |
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