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Probing atomic displacements with thermal differential EXAFS

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Ruffoni, M. P., Pettifer, R. F., Pascarelli, S., Trapananti, A. and Mathon, O. (2007) Probing atomic displacements with thermal differential EXAFS. Journal of Synchrotron Radiation, Vol.14 (No.5). pp. 421-425. doi:10.1107/S0909049507028452

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Official URL: http://dx.doi.org/10.1107/S0909049507028452

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Abstract

Differential extended X-ray absorption fine structure (DiffEXAFS) is a novel technique for the study of small atomic strains. Here the development of this technique to the measurement of thermally induced strain is presented. Thermal DiffEXAFS measurements have been performed on alpha-Fe and SrF2, yielding alpha = (11.6 +/- 0.4) x 10(-6) K-1 and (19 +/- 2) x 10(- 6) K-1, respectively. These are in good agreement with accepted values, proving the viability of the technique. Analysis has revealed sensitivity to mean atomic displacements of 0.3 fm.

Item Type: Journal Article
Subjects: Q Science > QC Physics
Divisions: Faculty of Science > Physics
Journal or Publication Title: Journal of Synchrotron Radiation
Publisher: Wiley-Blackwell Publishing Ltd.
ISSN: 0909-0495
Official Date: September 2007
Dates:
DateEvent
September 2007Published
Volume: Vol.14
Number: No.5
Number of Pages: 5
Page Range: pp. 421-425
DOI: 10.1107/S0909049507028452
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access

Data sourced from Thomson Reuters' Web of Knowledge

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