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Probing atomic displacements with thermal differential EXAFS
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Ruffoni, M. P., Pettifer, R. F., Pascarelli, S., Trapananti, A. and Mathon, O. (2007) Probing atomic displacements with thermal differential EXAFS. Journal of Synchrotron Radiation, Vol.14 (No.5). pp. 421-425. doi:10.1107/S0909049507028452
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Official URL: http://dx.doi.org/10.1107/S0909049507028452
Abstract
Differential extended X-ray absorption fine structure (DiffEXAFS) is a novel technique for the study of small atomic strains. Here the development of this technique to the measurement of thermally induced strain is presented. Thermal DiffEXAFS measurements have been performed on alpha-Fe and SrF2, yielding alpha = (11.6 +/- 0.4) x 10(-6) K-1 and (19 +/- 2) x 10(- 6) K-1, respectively. These are in good agreement with accepted values, proving the viability of the technique. Analysis has revealed sensitivity to mean atomic displacements of 0.3 fm.
| Item Type: | Journal Article | ||||
|---|---|---|---|---|---|
| Subjects: | Q Science > QC Physics | ||||
| Divisions: | Faculty of Science > Physics | ||||
| Journal or Publication Title: | Journal of Synchrotron Radiation | ||||
| Publisher: | Wiley-Blackwell Publishing Ltd. | ||||
| ISSN: | 0909-0495 | ||||
| Official Date: | September 2007 | ||||
| Dates: |
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| Volume: | Vol.14 | ||||
| Number: | No.5 | ||||
| Number of Pages: | 5 | ||||
| Page Range: | pp. 421-425 | ||||
| DOI: | 10.1107/S0909049507028452 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access |
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