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Paradigm shifts in surface metrology. Part I. Historical philosophy

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Jiang, X., Scott, P. J., Whitehouse, D. J. (David J.) and Blunt, L. (2007) Paradigm shifts in surface metrology. Part I. Historical philosophy. Royal Society of London. Proceedings A. Mathematical, Physical and Engineering Sciences, Vol.463 (No.2085). pp. 2049-2070. ISSN 1364-5021

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Official URL: http://dx.doi.org/10.1098/rspa.2007.1874

Abstract

Surface texture and its measurement are becoming the most critical factors and important functionality indicators in the performance of high precision and nanoscale devices and components. Surface metrology as a discipline is currently undergoing a huge paradigm shift: from pro. le to areal characterization, from stochastic to structured surfaces, and from simple geometries to complex free-form geometries, all spanning the millimetre to sub-nanometre scales. This paper builds a complete philosophical framework for surface metrology through a review of the paradigm shifts that have occurred in the discipline of surface metrology, tracing the development of fundamental philosophies and techniques. The paper starts with a brief overview of the historical paradigm shifts and builds an up-to-date foundational philosophy, capable of rapid and effective development. The growth in interest in surface metrology stems mainly from the need to control the manufacture of armaments during the Second World War and the production of domestic goods and appliances since that time. The surfaces produced by manufacture seemed to offer the possibility of being useful for process control. Unfortunately, only a few tentative investigations had been carried out to establish usable relationships between the processes, the machine tools and the available surface parameters (with their limitations). Even fewer investigations had been carried out to relate surface geometry to the performance of manufactured products. The result was that the metrology was unprepared and, consequently, the progress was sporadic. This overall review is given in two parts. Part I focuses on the historical philosophy of surface metrology and Part II discusses the progress within the current paradigm shift.

Item Type: Journal Item
Subjects: Q Science
Divisions: Faculty of Science > Engineering
Journal or Publication Title: Royal Society of London. Proceedings A. Mathematical, Physical and Engineering Sciences
Publisher: The Royal Society Publishing
ISSN: 1364-5021
Date: 8 September 2007
Volume: Vol.463
Number: No.2085
Number of Pages: 22
Page Range: pp. 2049-2070
Identification Number: 10.1098/rspa.2007.1874
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
URI: http://wrap.warwick.ac.uk/id/eprint/31662

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