The Library
An approach to the dynamic detection of outliers in electronics production
Tools
Tools
Tools
Hill, J. F., Morris, C. and Gabriel, R. (2007) An approach to the dynamic detection of outliers in electronics production. International Journal of Production Research , Vol.45 (No.3). pp. 765-778. doi:10.1080/00207540600792283
Research output not available from this repository.
Request-a-Copy directly from author or use local Library Get it For Me service.
Official URL: http://dx.doi.org/10.1080/00207540600792283
Abstract
There are many cases, especially in the electronics industry, of manufacturing activities involving very high volumes of components that, whilst individually costing very little, can cause very expensive failures or recalls upon unexpected failure. The identification of such outliers in component supply is therefore of great interest. These items are often within design technical specification but their deviation from the characteristies of the rest of the population may be indicative of some underlying cause that can lead to their premature failure in service. Identification of outliers using conventional statistical process control (SPC) and Control Charting techniques is often uncertain and most other published methods are inappropriate for dynamic monitoring. This paper proposes a simple and practical technique that has proved successful in identifying such components whilst minimizing 'false alarms'. In many cases these items have subsequently been found to pass short-term inspection tests but fail well short of their design life.
| Item Type: | Journal Article | ||||
|---|---|---|---|---|---|
| Subjects: | T Technology T Technology > TS Manufactures H Social Sciences > HD Industries. Land use. Labor > HD28 Management. Industrial Management |
||||
| Divisions: | Faculty of Science, Engineering and Medicine > Engineering > WMG (Formerly the Warwick Manufacturing Group) | ||||
| Journal or Publication Title: | International Journal of Production Research | ||||
| Publisher: | Taylor & Francis Ltd. | ||||
| ISSN: | 0020-7543 | ||||
| Official Date: | 1 February 2007 | ||||
| Dates: |
|
||||
| Volume: | Vol.45 | ||||
| Number: | No.3 | ||||
| Number of Pages: | 14 | ||||
| Page Range: | pp. 765-778 | ||||
| DOI: | 10.1080/00207540600792283 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access | ||||
| Title of Event: | 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing (MASM 2005) | ||||
| Type of Event: | Conference | ||||
| Location of Event: | Suntec City, Singapore | ||||
| Date(s) of Event: | October 06-07, 2005 |
Data sourced from Thomson Reuters' Web of Knowledge
Request changes or add full text files to a record
Repository staff actions (login required)
 |
View Item |
