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Verifying DiffEXAFS measurements with differential X-ray diffraction
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Ruffoni, M. P., Pettifer, R. F., Pascarelli, S. and Mathon, O. (2007) Verifying DiffEXAFS measurements with differential X-ray diffraction. Journal of Synchrotron Radiation, Volume 14 (Part 1). pp. 169-172. doi:10.1107/S0909049506049971 ISSN 0909-0495.
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Official URL: http://dx.doi.org/10.1107/S0909049506049971
Abstract
Differential EXAFS (DiffEXAFS) is a novel technique for measuring atomic perturbations on a local scale. Here a complementary technique for such studies is presented: differential X-ray diffraction (DiffXRD), which may be used to independently verify DiffEXAFS results whilst using exactly the same experimental apparatus and measurement technique. A test experiment has been conducted to show that DiffXRD can be used to successfully determine the thermal expansion coefficient of SrF2.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QC Physics | ||||
Divisions: | Faculty of Science, Engineering and Medicine > Science > Physics | ||||
Journal or Publication Title: | Journal of Synchrotron Radiation | ||||
Publisher: | Wiley-Blackwell Publishing Ltd. | ||||
ISSN: | 0909-0495 | ||||
Official Date: | January 2007 | ||||
Dates: |
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Volume: | Volume 14 | ||||
Number: | Part 1 | ||||
Number of Pages: | 4 | ||||
Page Range: | pp. 169-172 | ||||
DOI: | 10.1107/S0909049506049971 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
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