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Mapping surface properties of sinusoidal roughness standards by TPM
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Liu, Xianping and Rubert, P. (2005) Mapping surface properties of sinusoidal roughness standards by TPM. In: 7th Symposium on Measurement Technology and Intelligent Instruments, Huddersfield, UK, 06-08 Sep 2005. Published in: Journal of Physics: Conference Series, 13 pp. 20-23. doi:10.1088/1742-6596/13/1/005 ISSN 1742-6596.
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Official URL: http://dx.doi.org/10.1088/1742-6596/13/1/005
Abstract
We report our investigation on the surface properties of sinusoidal roughness standards made from pure electroformed nickel. Two specimens having a sinusoidal profile with nominal R-a of 0.36 mu m and a peak spacing of 25 mu m are chosen for this investigation. One specimen is further treated with a hard protective coating of nickel-boron. The surface topography, friction, hardness and Young's modulus of the specimens were measured by a novel instrument, the multi-function Tribological Probe Microscope (TPM). The results show that hardness of these two specimens is 14.1GPa for uncoated specimen and 25.7GPa for the coated one, while the Young's modulus is 188GPa and 225GPa, respectively. The ramping force was set to 3mN for both the specimens and the effect of the tip penetration was investigated by comparing the topography measurements before and after hardness mapping. It has been found out that there is no significant change in the averaged profiles over the scanned area, which indicates the topography distortion seen in the multi-function mapping, is recoverable. Cross correlation between topography and its corresponding hardness/Young's modulus has been carried out and the result will be discussed in the paper.
Item Type: | Conference Item (Paper) | ||||
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Subjects: | Q Science > QC Physics | ||||
Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||
Series Name: | JOURNAL OF PHYSICS CONFERENCE SERIES | ||||
Journal or Publication Title: | Journal of Physics: Conference Series | ||||
Publisher: | Institute of Physics Publishing Ltd. | ||||
ISSN: | 1742-6596 | ||||
Editor: | Jiang, XJ and Whitehouse, DJ | ||||
Official Date: | 2005 | ||||
Dates: |
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Volume: | 13 | ||||
Number of Pages: | 4 | ||||
Page Range: | pp. 20-23 | ||||
DOI: | 10.1088/1742-6596/13/1/005 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Conference Paper Type: | Paper | ||||
Title of Event: | 7th Symposium on Measurement Technology and Intelligent Instruments | ||||
Type of Event: | Other | ||||
Location of Event: | Huddersfield, UK | ||||
Date(s) of Event: | 06-08 Sep 2005 |
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