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Measurement of coating thickness using ultrasonic resononance spectroscopy - art. no. 61790B
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Palmer, Stuart B., Dixon, S., Lanyon, Ben and Rowlands, G. (George) (2006) Measurement of coating thickness using ultrasonic resononance spectroscopy - art. no. 61790B. In: Conference on Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring II, San Diego, CA, MAR 01-02, 2006. Published in: Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring II, 6179 B1790-B1790. ISBN 0-8194-6232-2. doi:10.1117/12.654753 ISSN 0277-786X.
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Official URL: http://dx.doi.org/10.1117/12.654753
Abstract
A technique has been developed whereby the thickness and elastic modulus of a coating applied to a substrate can be calculated from measurement of the resonant bulk wave ultrasonic modes of the combined substrate and coating. The density of the coating and the material properties of the substrate are required for this method. We have investigated the difference between models that take account of material attenuation and simpler models that do not and have found that there is little difference in the predicted resonant frequencies of the system for modes that-can be observed in the experimental data. We have applied the technique to explain the experimental measurements for a 100 mu m thick epoxy resin coating curing on a 1mm thick aluminium substrate using wideband radially polarised SH shear waves. In this dynamic system the elastic properties of the coating change and particular resonant modes not only shift but can disappear or appear in the experimental data. A model is used to explain this behaviour and show that the technique has potential for coating thickness measurement in other areas. We have taken samples of 220 mu m thick aluminium sheet with a fully cured epoxy coating of nominal thickness 11 mu m, and have used ultrasonic measurements to calculate the thickness of the epoxy coating layer.
| Item Type: | Conference Item (UNSPECIFIED) | ||||
|---|---|---|---|---|---|
| Subjects: | Q Science > QC Physics | ||||
| Series Name: | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) | ||||
| Journal or Publication Title: | Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring II | ||||
| Publisher: | SPIE-INT SOC OPTICAL ENGINEERING | ||||
| ISBN: | 0-8194-6232-2 | ||||
| ISSN: | 0277-786X | ||||
| Editor: | Meyendorf, N and Baaklini, GY and Michel, B | ||||
| Official Date: | 2006 | ||||
| Dates: |
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| Volume: | 6179 | ||||
| Number of Pages: | 8 | ||||
| Page Range: | B1790-B1790 | ||||
| DOI: | 10.1117/12.654753 | ||||
| Publication Status: | Published | ||||
| Title of Event: | Conference on Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring II | ||||
| Location of Event: | San Diego, CA | ||||
| Date(s) of Event: | MAR 01-02, 2006 |
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