Yeo, H. C., Guo, N., Du, H., Huang, W. M. and Jian, X. M. (2006) Characterisation of IC packaging interfaces and loading effects. In: 17th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, Wuppertal, GERMANY, OCT 03-06, 2006. Published in: MICROELECTRONICS RELIABILITY, 46 (9-11 Sp. Iss. SI). pp. 1892-1897. doi:10.1016/j.microrel.2006.07.087 ISSN 0026-2714.

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Abstract

In IC packaging, the quality of the interfaces such as that between mold compound and silicon is a critical issue in the reliability testing during the manufacturing process and in-service. Weak interfaces have often gone undetected and may become potentially defective at a later stage. Furthermore, the stress due to mechanical or thermal loading may further deteriorate the interface quality, making the interface unreliable. There is a desire to study the interface quality quantitatively, so potential defects can be evaluated and identified early. In this paper, finite element analysis using multilayer interface model is used to study the reflection coefficient from the interface of varying quality. Different conditioning techniques were used to degrade the interface quality. Characterisation of the interface quality of the MC/Si interface was conducted using longitudinal ultrasonic wave propagation with contact transducers. A combined test that measures the reflection coefficient of the interface under stress load was also conducted to quantify the effect of the load. A nondestructive evaluation methodology is proposed that measures the available strength of the interface by using ultrasonic reflection coefficients, and it shows the correlation between the reflection coefficient and available strength of the interface can be developed and used as a quantitative indicator.

Item Type:	Conference Item (UNSPECIFIED)
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering T Technology Q Science > QC Physics
Journal or Publication Title:	MICROELECTRONICS RELIABILITY
Publisher:	PERGAMON-ELSEVIER SCIENCE LTD
ISSN:	0026-2714
Official Date:	September 2006
Dates:	Date Event September 2006 UNSPECIFIED
Volume:	46
Number:	9-11 Sp. Iss. SI
Number of Pages:	6
Page Range:	pp. 1892-1897
DOI:	10.1016/j.microrel.2006.07.087
Publication Status:	Published
Title of Event:	17th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Location of Event:	Wuppertal, GERMANY
Date(s) of Event:	OCT 03-06, 2006

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