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Weak localization and charge-carrier interaction effects in a two-dimensional hole gas in a germanium quantum well in a SiGe/Ge/SiGe heterostructure
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Berkutov, I. B., Komnik, Yu. F., Andrievskii, V. V., Mironov, O. A., Myronov, Maksym and Leadley, D. R. (David R.) (2006) Weak localization and charge-carrier interaction effects in a two-dimensional hole gas in a germanium quantum well in a SiGe/Ge/SiGe heterostructure. Low Temperature Physics, Volume 32 (Number 7). pp. 683-688. doi:10.1063/1.2216282 ISSN 1063-777X.
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Official URL: http://dx.doi.org/10.1063/1.2216282
Abstract
The weak localization and interaction effects for charge carriers in a two-dimensional hole gas in a pure germanium quantum well in a SiGe/Ge/SiGe heterostructure with a hole density of 5.68x10(11) cm(-2) and mobility of 4.68x10(4) cm(2) V-1 s(-1) are investigated. The resistance measurements were made at temperatures from 46 mK to 10 K and magnetic fields up to 15 T. The magnetic-field dependence of the resistivity exhibits Shubnikov-de Haas oscillations and quantum Hall effect steps. At very low magnetic fields (B < 0.1 T) a weak localization effect for holes is revealed, which makes for a negative magnetoresistance and growth of the resistance with decreasing temperature (at T < 2 K). The manifestation of the interaction effect is observed and analyzed over a wide range of temperatures and magnetic fields. With increasing temperature the manifestation of the interaction-induced quantum correction passes from the diffusive regime to an intermediate and then to the ballistic regime. In all regions the behavior of the interaction quantum correction is in good agreement with the modern theoretical predictions. (c) 2006 American Institute of Physics.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QC Physics | ||||
Divisions: | Faculty of Science, Engineering and Medicine > Science > Physics | ||||
Journal or Publication Title: | Low Temperature Physics | ||||
Publisher: | American Institute of Physics | ||||
ISSN: | 1063-777X | ||||
Official Date: | July 2006 | ||||
Dates: |
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Volume: | Volume 32 | ||||
Number: | Number 7 | ||||
Number of Pages: | 6 | ||||
Page Range: | pp. 683-688 | ||||
DOI: | 10.1063/1.2216282 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published |
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