A dependability-driven system-level design approach for embedded systems
UNSPECIFIED (2005) A dependability-driven system-level design approach for embedded systems. In: Design, Automation and Test in Europe Conference and Exhibition (DATE 05), Munich, GERMANY, MAR 07-11, 2005. Published in: DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS pp. 372-377.Full text not available from this repository.
The objective of this paper is to introduce dependability as an optimization criterion in the system-level design process of embedded systems. Given the pervasiveness of embedded systems, especially in the area of highly dependable and safety-critical systems, it is imperative to directly consider dependability in the system level design process. This naturally leads to a multi-objective optimization problem, as cost and time have to be considered too. This paper proposes a genetic algorithm to solve this multi-objective optimization problem and to determine a set of Pareto optimal design alternatives in a single optimization run. Based on these alternatives, the designer can choose his best solution, finding the desired tradeoff between cost, schedulability, and dependability.
|Item Type:||Conference Item (UNSPECIFIED)|
|Subjects:||Q Science > QA Mathematics > QA76 Electronic computers. Computer science. Computer software
T Technology > TK Electrical engineering. Electronics Nuclear engineering
|Series Name:||Design, Automation and Test in Europe Conference and Expo|
|Journal or Publication Title:||DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS|
|Publisher:||IEEE COMPUTER SOC|
|Editor:||Wehn, N and Benini, L|
|Number of Pages:||6|
|Page Range:||pp. 372-377|
|Title of Event:||Design, Automation and Test in Europe Conference and Exhibition (DATE 05)|
|Location of Event:||Munich, GERMANY|
|Date(s) of Event:||MAR 07-11, 2005|
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