UNSPECIFIED (2005) A dependability-driven system-level design approach for embedded systems. In: Design, Automation and Test in Europe Conference and Exhibition (DATE 05), MAR 07-11, 2005, Munich, GERMANY.

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Abstract

The objective of this paper is to introduce dependability as an optimization criterion in the system-level design process of embedded systems. Given the pervasiveness of embedded systems, especially in the area of highly dependable and safety-critical systems, it is imperative to directly consider dependability in the system level design process. This naturally leads to a multi-objective optimization problem, as cost and time have to be considered too. This paper proposes a genetic algorithm to solve this multi-objective optimization problem and to determine a set of Pareto optimal design alternatives in a single optimization run. Based on these alternatives, the designer can choose his best solution, finding the desired tradeoff between cost, schedulability, and dependability.

Item Type:	Conference Item (UNSPECIFIED)
Subjects:	Q Science > QA Mathematics > QA76 Electronic computers. Computer science. Computer software T Technology > TK Electrical engineering. Electronics Nuclear engineering
Series Name:	Design, Automation and Test in Europe Conference and Expo
Journal or Publication Title:	DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS
Publisher:	IEEE COMPUTER SOC
ISBN:	0-7695-2288-2
ISSN:	1530-1591
Editor:	Wehn, N and Benini, L
Date:	2005
Number of Pages:	6
Page Range:	pp. 372-377
Publication Status:	Published
Title of Event:	Design, Automation and Test in Europe Conference and Exhibition (DATE 05)
Location of Event:	Munich, GERMANY
Date(s) of Event:	MAR 07-11, 2005
URI:	http://wrap.warwick.ac.uk/id/eprint/34130

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