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The use of ultra-low-energy dynamic SIMS in the study of the tarnishing of silver
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UNSPECIFIED (2005) The use of ultra-low-energy dynamic SIMS in the study of the tarnishing of silver. In: Workshop of the COST G8 Action on Non-destructive Analysis and Testing of Museum Objects, Ljubljana, SLOVENIA, JUN 09-10, 2004. Published in: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 239 (1-2). pp. 51-64. doi:10.1016/j.nimb.2005.06.179 ISSN 0168-583X.
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Official URL: http://dx.doi.org/10.1016/j.nimb.2005.06.179
Abstract
This paper describes a new application in cultural heritage and other areas for a highly surface specific analytical technique originally developed for semiconductor research. The technique, ultra-low-energy dynamic secondary ion mass spectrometry (uleSIMS), is microdestructive, but has a sensitivity typically better than 1 atom in 10(6). It can provide an analysis within the top nm, or the top few put of a surface, and gives chemical fingerprinting as well as atomic composition information. It is complimentary to other near-surface techniques such as SEM-EDX, XRD and electrochemical methods. Here, we describe the use of uleSIMS with SEM and SEM-EDX in a study of the tarnishing of museum silver. We report on the initial stages in the development of reference surfaces for control experiments, and on the data obtained from a lightly tarnished sterling silver test coupon exposed in a museum environment for 2 years. First results from a study of a XVIIc. silver fragment, aimed at detecting differences in the tarnish or coating in different areas are also presented. Overall we show that the surface chemistry of all these surfaces is a complex mixture of that due to corrosion, contaminants deposited by solvents, polish media (in an overlayer which may only be a few nm thick), handling and the environment, as well as particulates - both from the environment and from polishes. However, surfaces with different histories show large variations in their uleSIMS spectra and depth profiles, and we attempt to lay the groundwork for the interpretation of these. (c) 2005 Elsevier B.V. All rights reserved.
Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | Q Science > QC Physics | ||||
Journal or Publication Title: | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | ||||
Publisher: | ELSEVIER SCIENCE BV | ||||
ISSN: | 0168-583X | ||||
Official Date: | September 2005 | ||||
Dates: |
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Volume: | 239 | ||||
Number: | 1-2 | ||||
Number of Pages: | 14 | ||||
Page Range: | pp. 51-64 | ||||
DOI: | 10.1016/j.nimb.2005.06.179 | ||||
Publication Status: | Published | ||||
Title of Event: | Workshop of the COST G8 Action on Non-destructive Analysis and Testing of Museum Objects | ||||
Location of Event: | Ljubljana, SLOVENIA | ||||
Date(s) of Event: | JUN 09-10, 2004 |
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