Kennedy, Leslie W., 1947- (1978) Large scale integrated (LSI) bipolar circuits : a study of integrated injection logic. PhD thesis, University of Warwick.

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Abstract

This thesis is a description of integrated injection logic, a bipolar large scale integration technique. Various alternatives to integrated injection logic are discussed and the advantages and disadvantages of each are outlined. The integrated injection logic structure is introduced and its advantages over other solutions are described. Those device characteristics necessary for successful operation of the integrated injection logic gate are established, and the physical mechanisms controlling D. C. and A. C. performance are investigated theoretically. These theoretical investigations are compared with experimental observations. The behaviour of the I2L gate is shown to be very dependent on the characteristics of the epitaxial emitter and the intrinsic base region of the device. In an extension to the basic device theory it is shown that the device characteristics can be related to the transistor characteristics in the conventional mode of operation. As the technique is primarily for large scale integration a considerable effort has been placed on yield studies. These yield studies have included work on the following: parametric control, photoengraving and silicon crystallographic defects. Silicon crystallographic defects are shown to be a major yield hazard and appropriate actions to eliminate them as failure mechanisms are described.

Item Type:	Thesis or Dissertation (PhD)
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Library of Congress Subject Headings (LCSH):	Integrated injection logic, Bipolar integrated circuits
Date:	1978
Institution:	University of Warwick
Theses Department:	School of Engineering
Thesis Type:	PhD
Publication Status:	Unpublished
Supervisor(s)/Advisor:	Blatt, V. ; Sumerling, G.
Extent:	xv, 298 leaves
Language:	eng
URI:	http://wrap.warwick.ac.uk/id/eprint/34690

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