Kwesah, Ali Hadi, 1944- (1977) Characterization of integrated bipolar transistors using computer aided measurements and optimisation. PhD thesis, University of Warwick.

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Abstract

The objective of this thesis was to develop a method for measuring integrated bipolar transistors forming part of an integrated circuit chip. These integrated circuits were produced at Plessey, Caswell. The measurement technique was then used to investigate the validity of the equivalent circuit at present used by Plessey's, over the frequency range up to and beyond fT. The measuring system was based on the Hewlett Packard microwave network analyser. A computer aided correction program has been implemented for calibrating the measuring system. This establishes the measurement plane at the terminals of the device, eliminating all the parasitic components. For calibrating the measuring system, purpose made standards of chip size were made. Ideally one of these would be a perfect matched load. This is difficult to achieve at microwave frequencies. Instead, a thin-film resistor was used. This was characterized and its frequency dependence taken into account in the calibration program. Using the above computer aided system, the complex S-parameters of the integrated bipolar transistors were measured at several bias conditions. Optimization was used to obtain values for the equivalent circuit from the measured S-parameters. An appropriate objective function with suitable boundary conditions has been formulated in terms of the measured S-parameters and those calculated from the equivalent circuit. The component values of the equivalent circuit which give agreement between the measured and calculated S-parameters have been obtained by applying the Hooke and Jeeves optimization routine to minimize the objective function.

Item Type:	Thesis or Dissertation (PhD)
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Library of Congress Subject Headings (LCSH):	Bipolar transistors -- Measurement, Microwave transistors -- Measurement, Integrated circuits
Date:	July 1977
Institution:	University of Warwick
Theses Department:	School of Engineering
Thesis Type:	PhD
Publication Status:	Unpublished
Supervisor(s)/Advisor:	McPhun, Michael Keith, 1934-
Extent:	178, [4] leaves
Language:	eng
URI:	http://wrap.warwick.ac.uk/id/eprint/34692

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