Claus, Daniel, Fritzsche, Marco, Iliescu, Daciana, Timmerman, B. H. (Brenda H.) and Bryanston-Cross, P. (2011) High-resolution digital holography utilized by the subpixel sampling method. Applied Optics, Vol.50 (No.24). pp. 4711-4719. doi:10.1364/AO.50.004711

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Abstract

A novel (to our knowledge) approach for resolution improvement in digital holography is presented in this paper. The proposed method is based on recording the incoming interference field on a complementary metal-oxide semiconductor (CMOS) camera with subpixel resolution. The method takes advantage of the small pixel size of the CMOS sensor, while overcoming the reduced fill factor. This paper describes the experimental and numerical procedures. The improvement of the obtainable optical resolution, image quality, and phase measurement accuracy are demonstrated within this paper.

Item Type:	Journal Article
Subjects:	Q Science > QC Physics T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:	Faculty of Science > Engineering
Library of Congress Subject Headings (LCSH):	Holography, Imaging systems -- Image quality, Resolution (Optics), Metal oxide semiconductors, Complementary
Journal or Publication Title:	Applied Optics
Publisher:	Optical Society of America
ISSN:	0003-6935
Official Date:	20 August 2011
Dates:	Date Event 20 August 2011 Published
Date of first compliant deposit:	18 December 2015
Volume:	Vol.50
Number:	No.24
Number of Pages:	9
Page Range:	pp. 4711-4719
DOI:	10.1364/AO.50.004711
Status:	Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Restricted or Subscription Access
Funder:	Warwick Innovative Manufacturing Research Centre (IMRC)
Grant number:	R.ESCM 9231 (IMRC)

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