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High-resolution digital holography utilized by the subpixel sampling method

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Claus, Daniel, Fritzsche, Marco, Iliescu, Daciana, Timmerman, B. H. (Brenda H.) and Bryanston-Cross, P.. (2011) High-resolution digital holography utilized by the subpixel sampling method. Applied Optics, Vol.50 (No.24). pp. 4711-4719. ISSN 0003-6935

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Official URL: http://dx.doi.org/10.1364/AO.50.004711

Abstract

A novel (to our knowledge) approach for resolution improvement in digital holography is presented in this paper. The proposed method is based on recording the incoming interference field on a complementary metal-oxide semiconductor (CMOS) camera with subpixel resolution. The method takes advantage of the small pixel size of the CMOS sensor, while overcoming the reduced fill factor. This paper describes the experimental and numerical procedures. The improvement of the obtainable optical resolution, image quality, and phase measurement accuracy are demonstrated within this paper.

Item Type:

Journal Article

Subjects:

Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering

Divisions:

Faculty of Science > Engineering

Library of Congress Subject Headings (LCSH):

Holography, Imaging systems -- Image quality, Resolution (Optics), Metal oxide semiconductors, Complementary

Journal or Publication Title:

Applied Optics

Publisher:

Optical Society of America

ISSN:

0003-6935

Official Date:

20 August 2011

Dates:

Date	Event
20 August 2011	Published

Volume:

Vol.50

Number:

No.24

Number of Pages:

Page Range:

pp. 4711-4719

Identification Number:

10.1364/AO.50.004711

Status:

Peer Reviewed

Publication Status:

Published

Access rights to Published version:

Restricted or Subscription Access

Funder:

Warwick Innovative Manufacturing Research Centre (IMRC)

Grant number:

R.ESCM 9231 (IMRC)

References:

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