Petcher, P. A. and Dixon, S. (2011) Time of flight diffraction and imaging (TOFDI) combining B- scans and cross-sectional imaging. AIP Conference Proceedings . pp. 744-751. doi:10.1063/1.3591923 ISSN 0094-243X.

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Abstract

Time of Flight Diffraction and Imaging (ToFDI), based on Time of Flight Diffraction (ToFD), uses a sparse transducer array (laser-EMAT for non-contact applications), and adds an imaging stage based on multiple wave mode (and mode-converted) ultrasound scattering by defects. B-scans are processed to remove direct and reflected surface waves, enhance parabolas, and combine multiple B-scans. Outputting an improved B-scan and a cross-sectional image, the final objective is the automated detection, identification, positioning and sizing for all defects in a sample.

Item Type:	Journal Article
Subjects:	Q Science > QC Physics
Divisions:	Faculty of Science, Engineering and Medicine > Engineering > Engineering Faculty of Science, Engineering and Medicine > Science > Physics
Library of Congress Subject Headings (LCSH):	Diffraction, Time-of-flight mass spectrometry, Cross-sectional imaging
Journal or Publication Title:	AIP Conference Proceedings
Publisher:	American Institute of Physics
ISBN:	9780735408883
ISSN:	0094-243X
Editor:	Thompson, D. O. and Chimenti, Dale E.
Official Date:	23 June 2011
Dates:	Date Event 23 June 2011 Published
Page Range:	pp. 744-751
DOI:	10.1063/1.3591923
Status:	Peer Reviewed
Publication Status:	Published
Version or Related Resource:	Petcher, P. A. and Dixon, S. (2011). Time of flight diffraction and imaging (TOFDI)combining B- scans and cross-sectional imaging. QNDE 2010 - San Diego, California, July 18 – 23, 2010.

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