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Long-lived spin coherence in silicon with an electrical spin trap readout
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Morley, Gavin, McCamey, D., Seipel, H., Brunel, L.-C., Tol, J. (Johan) van and Boehme, C. (2008) Long-lived spin coherence in silicon with an electrical spin trap readout. Physical Review Letters, Vol.101 (No.20). pp. 207602-1. doi:10.1103/PhysRevLett.101.207602 ISSN 0031-9007.
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Official URL: http://dx.doi.org/10.1103/PhysRevLett.101.207602
Abstract
Pulsed electrically detected magnetic resonance of phosphorous (31P) in bulk crystalline silicon at very high magnetic fields (B0>8.5 T) and low temperatures (T=2.8 K) is presented. We find that the spin-dependent capture and reemission of highly polarized (>95%) conduction electrons by equally highly polarized 31P donor electrons introduces less decoherence than other mechanisms for spin-to-charge conversion. This allows the electrical detection of spin coherence times in excess of 100 μs, 50 times longer than the previous maximum for electrically detected spin readout experiments.
| Item Type: | Journal Article | ||||
|---|---|---|---|---|---|
| Subjects: | Q Science > QC Physics | ||||
| Divisions: | Faculty of Science, Engineering and Medicine > Science > Physics | ||||
| Library of Congress Subject Headings (LCSH): | Silicon, Nuclear spin, Coherence (Nuclear physics) | ||||
| Journal or Publication Title: | Physical Review Letters | ||||
| Publisher: | American Physical Society | ||||
| ISSN: | 0031-9007 | ||||
| Official Date: | 14 November 2008 | ||||
| Dates: |
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| Volume: | Vol.101 | ||||
| Number: | No.20 | ||||
| Number of Pages: | 4 | ||||
| Page Range: | pp. 207602-1 | ||||
| DOI: | 10.1103/PhysRevLett.101.207602 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access | ||||
| Funder: | National High Magnetic Field Laboratory (NHMFL), National Science Foundation (U.S.) (NSF), United States. Dept of Energy, Florida, Engineering and Physical Sciences Research Council (EPSRC) | ||||
| Grant number: | 7300-100 (NHMFL), DMR-0084173 (NSF), GR/S23506 (EPSRC), EP/D049717/1 (EPSRC), EP/F04139X/1 (EPSRC) |
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