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An industry-based survey of reliability in power electronic converters

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Yang, Shaoyong, Bryant, Angus T., Mawby, P. A., Xiang, Dawei, Ran, Li and Tavner, Peter J. (2011) An industry-based survey of reliability in power electronic converters. IEEE Transactions on Industry Applications, Vol.47 (No.3). pp. 1441-1451. doi:10.1109/TIA.2011.2124436 ISSN 0093-9994.

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Official URL: http://dx.doi.org/10.1109/TIA.2011.2124436

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Abstract

A questionnaire survey was carried out to determine the industrial requirements and expectations of reliability in power electronic converters. The survey was subjective and conducted with a number of high-profile semiconductor manufacturers, integrators, and users in the aerospace, automation, motor drive, utility power, and other industry sectors. According to the survey, power semiconductor devices ranked the most fragile components. It was concluded that main stresses were from the environment, transients, and heavy loads, which should be considered during power electronic system design and normal operation. This paper has also highlighted that there is a significant need identified by the responders for better reliability-monitoring methods and indicators.

Item Type: Journal Article
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Science, Engineering and Medicine > Engineering > Engineering
Library of Congress Subject Headings (LCSH): Power electronics, Electric current converters -- Reliability
Journal or Publication Title: IEEE Transactions on Industry Applications
Publisher: IEEE
ISSN: 0093-9994
Official Date: May 2011
Dates:
DateEvent
May 2011Published
Volume: Vol.47
Number: No.3
Page Range: pp. 1441-1451
DOI: 10.1109/TIA.2011.2124436
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
Funder: Engineering and Physical Sciences Research Council (EPSRC)
Grant number: EP/E02744X/1 (EPSRC), EP/E026923/1 (EPSRC)

Data sourced from Thomson Reuters' Web of Knowledge

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