Dangers of using Falconer’s Heritability estimate with typical imaging genetic sample sizes
Nichols, Thomas E., Friston, K. J. (Karl J.), Roiser, Jonathan and Viding, Essi (2010) Dangers of using Falconer’s Heritability estimate with typical imaging genetic sample sizes. In: Poster Session at the 6th International Imaging Genetics Conference, Irvine, CA, U.S.A., Jan 18-19, 2010Full text not available from this repository.
Official URL: http://www.imaginggenetics.uci.edu/posters_2010.as...
Aim of Investigation: Heritability is measured with twins studies, where the correlation of monozygotic (MZ, identical) and dizygotic (DZ, fraternal) twins indicates shared variation due to common environmental and/or genetic influences. The simplest estimate of narrow-sense (additive genetic) heritability is Falconer's estimate (Falconer, 1996). Another estimate comes from a components-of-variance approach, where a structured covariance model expresses the shared genetic and environmental effects (Neale, 1998). This approach has much greater flexibility and can be more powerful (Christian, 1995). While best practice in statistical genetics is to use the components-of-variance/SEM approach, Falconer's method is still widely used in imaging genetics studies. The purpose of this work is to demonstrate the poor performance of Falconer's method and demonstrate the limitations of even the best-practice approch at typical sample sizes.
|Item Type:||Conference Item (Poster)|
|Subjects:||Q Science > QA Mathematics
Q Science > QH Natural history > QH426 Genetics
|Divisions:||Faculty of Science > Statistics
Faculty of Science > WMG (Formerly the Warwick Manufacturing Group)
|Library of Congress Subject Headings (LCSH):||Genetics -- Statistical methods, Heredity -- Statistical methods, Sampling (Statistics)|
|Status:||Not Peer Reviewed|
|Conference Paper Type:||Poster|
|Title of Event:||Poster Session at the 6th International Imaging Genetics Conference|
|Type of Event:||Conference|
|Location of Event:||Irvine, CA, U.S.A.|
|Date(s) of Event:||Jan 18-19, 2010|
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