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A non-destructive method for the measurement of residual strains in semi-crystalline polymer components

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Hughes, Darren J., Heeley, E. L. and Curfs, C.. (2011) A non-destructive method for the measurement of residual strains in semi-crystalline polymer components. Materials Letters, Vol.65 (No.3). pp. 530-533. ISSN 0167-577X

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Official URL: http://dx.doi.org/10.1016/j.matlet.2010.10.046

Abstract

A new non-destructive tool is presented, enabling the measurement of locked-in residual strains in semi-crystalline polymer-based components. The technique employs high-energy synchrotron X-rays to probe the variation of diffraction angle within a well-defined 'gauge volume' with a spatial resolution of the order of 1 mm. Lattice strain is calculated from the diffraction angles. An overview of the experimental methodology and underlying principles involved in the non-destructive evaluation of residual strain in polymer-based components is given. Preliminary results show that synchrotron X-rays can be used successfully to measure the internal elastic residual strain field in polymer components, being potentially applicable to other materials. The method was used successfully to measure residual strains in a commercial high density polyethylene gas pipeline sample.

Item Type: Journal Article
Subjects: Q Science > QC Physics
T Technology > TA Engineering (General). Civil engineering (General)
Divisions: Faculty of Science > WMG (Formerly the Warwick Manufacturing Group)
Library of Congress Subject Headings (LCSH): Nondestructive testing, Residual stresses, Crystalline polymers
Journal or Publication Title: Materials Letters
Publisher: Elsevier BV
ISSN: 0167-577X
Date: 15 February 2011
Volume: Vol.65
Number: No.3
Number of Pages: 4
Page Range: pp. 530-533
Identification Number: 10.1016/j.matlet.2010.10.046
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
References: [1] Gopalakrishna HD, Narasimha Murthy HN, Krishna M, Vinod MS and Suresh AV. Eng Fail Anal 2010: 17; 361 [2] Withers PJ. Rep Prog Phys 2007: 70; 2211 [3] Sanchez LA and Hornberger LE. Opt Laser Eng 2002: 37; 27 [4] Maxwell AS and Turnbull A. Polym Test 2003: 22; 231 [5] Hornberger LE and DeVries KL. Exp Mech 1987: 27; 94 [6] Guan ZW and Boot JC. Polym Eng Sci 2004: 44; 10; 1828 [7] Clutton EQ and Williams JG. Polym Eng Sci 1995: 35; 17; 1381 [8] Pittman JFT, Whitham GP, Beech S and Gwynn D. Int Polym Proc 1994: 2; 130 [9] Heeley EL, Gough T, Bras W, Gleeson AJ, Coates PD and Ryan AJ. Nucl Instru Meth B 2005: 238; 21 [10] Pintschovius L. Neutron diffraction using a constant wavelength. In: Fitzpatrick ME, Lodini A, editors. Analysis of Residual Stress by Diffraction Using Neutron and Synchrotron Radiation, Taylor and Francis, London; 2003, p. 133-145 [11] Withers PJ. Use of Synchrotron X-ray Radiation for Stress Measurement. In: Fitzpatrick ME, Lodini A, editors. Analysis of Residual Stress by Diffraction Using Neutron and Synchrotron Radiation, Taylor and Francis, London; 2003, p. 170-189 [12] Fitch AN. J Res Natl Inst Stand Technol 2004: 109; 133 [13] Richard D, Ferrand M and Kearley GJ. J Neutron Res 1996: 4; 33 [14] Webster GA and Ezeilo AN. Physica B 1997: 234-236; 949 [15] Hughes DJ, Heeley EL and Curfs C. In prep. [16] Hughes DJ, James MN, Hattingh DG and Webster PJ. J Neutron Res 2003: 11; 289 [17] Long J, Kaizhi S, Jiliang J and Qing G. J Polym Sci 1998: 69; 323 [18] Nie M, Bai SB and Wang Q. Polym Bull 2010: 65; 609 [19] Metehri A, Serier B, Bachir bouiadjra B, Belhouari M and Mecirdi MA. Mater Design 2009: 30; 2332
URI: http://wrap.warwick.ac.uk/id/eprint/41539

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