Silk, Jonathan R., Dashwood, R. J. and Charter, R. J.. (2011) FIB-SIMS analysis of an aluminum alloy/SiC metal matrix composite. Surface and Interface Analysis, Vol.43 (No.1-2). pp. 488-491. ISSN 0142-2421

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Abstract

Polished surfaces of a fine-grained aluminum, silicon carbide metal matrix composite (MMC) were imaged using the ion-induced secondary electron emission in a FIB ion microscope. In these images a dispersion of particles with a distinct bright contrast are seen to be mainly located at the matrix aluminum grain/subgrain boundaries, and at the matrix/reinforcement interface. The particles range in size from 20 to 200 nm. FIB-SIMS was used to identify the composition of these particles as magnesium and oxygen-rich, and so, to corroborate SEM/EDS analyses. Analysis of the FIB images of the polished section showed that the areal density of the particles with distinct bright contrast was consistent with a composition of MgAl2O4.

Item Type:	Journal Article
Subjects:	T Technology > TA Engineering (General). Civil engineering (General)
Divisions:	Faculty of Science > WMG (Formerly the Warwick Manufacturing Group)
Journal or Publication Title:	Surface and Interface Analysis
Publisher:	John Wiley & Sons Ltd.
ISSN:	0142-2421
Date:	January 2011
Volume:	Vol.43
Number:	No.1-2
Page Range:	pp. 488-491
Identification Number:	10.1002/sia.3439
Status:	Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Restricted or Subscription Access
Description:	Special Issue: Proceedings of the Seventeenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVII, Toronto, Ontario, Canada, September 14-18, 2009
Version or Related Resource:	Presented at SIMS XVII, Toronto, Ontario, Canada, September 14-18, 2009.
URI:	http://wrap.warwick.ac.uk/id/eprint/41846

Data sourced from Thomson Reuters' Web of Knowledge

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