FIB-SIMS analysis of an aluminum alloy/SiC metal matrix composite
Silk, Jonathan R., Dashwood, R. J. and Charter, R. J.. (2011) FIB-SIMS analysis of an aluminum alloy/SiC metal matrix composite. Surface and Interface Analysis, Vol.43 (No.1-2). pp. 488-491. ISSN 0142-2421Full text not available from this repository.
Official URL: http://dx.doi.org/10.1002/sia.3439
Polished surfaces of a fine-grained aluminum, silicon carbide metal matrix composite (MMC) were imaged using the ion-induced secondary electron emission in a FIB ion microscope. In these images a dispersion of particles with a distinct bright contrast are seen to be mainly located at the matrix aluminum grain/subgrain boundaries, and at the matrix/reinforcement interface. The particles range in size from 20 to 200 nm. FIB-SIMS was used to identify the composition of these particles as magnesium and oxygen-rich, and so, to corroborate SEM/EDS analyses. Analysis of the FIB images of the polished section showed that the areal density of the particles with distinct bright contrast was consistent with a composition of MgAl2O4.
|Item Type:||Journal Article|
|Subjects:||T Technology > TA Engineering (General). Civil engineering (General)|
|Divisions:||Faculty of Science > WMG (Formerly the Warwick Manufacturing Group)|
|Journal or Publication Title:||Surface and Interface Analysis|
|Publisher:||John Wiley & Sons Ltd.|
|Official Date:||January 2011|
|Page Range:||pp. 488-491|
|Access rights to Published version:||Restricted or Subscription Access|
Special Issue: Proceedings of the Seventeenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVII, Toronto, Ontario, Canada, September 14-18, 2009
|Version or Related Resource:||Presented at SIMS XVII, Toronto, Ontario, Canada, September 14-18, 2009.|
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