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FIB-SIMS analysis of an aluminum alloy/SiC metal matrix composite
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Silk, Jonathan R., Dashwood, R. J. and Charter, R. J. (2011) FIB-SIMS analysis of an aluminum alloy/SiC metal matrix composite. Surface and Interface Analysis, Vol.43 (No.1-2). pp. 488-491. doi:10.1002/sia.3439 ISSN 0142-2421.
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Official URL: http://dx.doi.org/10.1002/sia.3439
Abstract
Polished surfaces of a fine-grained aluminum, silicon carbide metal matrix composite (MMC) were imaged using the ion-induced secondary electron emission in a FIB ion microscope. In these images a dispersion of particles with a distinct bright contrast are seen to be mainly located at the matrix aluminum grain/subgrain boundaries, and at the matrix/reinforcement interface. The particles range in size from 20 to 200 nm. FIB-SIMS was used to identify the composition of these particles as magnesium and oxygen-rich, and so, to corroborate SEM/EDS analyses. Analysis of the FIB images of the polished section showed that the areal density of the particles with distinct bright contrast was consistent with a composition of MgAl2O4.
Item Type: | Journal Article | ||||
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Subjects: | T Technology > TA Engineering (General). Civil engineering (General) | ||||
Divisions: | Faculty of Science, Engineering and Medicine > Engineering > WMG (Formerly the Warwick Manufacturing Group) | ||||
Journal or Publication Title: | Surface and Interface Analysis | ||||
Publisher: | John Wiley & Sons Ltd. | ||||
ISSN: | 0142-2421 | ||||
Official Date: | January 2011 | ||||
Dates: |
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Volume: | Vol.43 | ||||
Number: | No.1-2 | ||||
Page Range: | pp. 488-491 | ||||
DOI: | 10.1002/sia.3439 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Reuse Statement (publisher, data, author rights): | cited By (since 1996) 0 | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Description: | Special Issue: Proceedings of the Seventeenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVII, Toronto, Ontario, Canada, September 14-18, 2009 |
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Version or Related Resource: | Presented at SIMS XVII, Toronto, Ontario, Canada, September 14-18, 2009. |
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