Stable passivation of InN surface electron accumulation with sulphur treatment
Bailey, L. R., Veal, T. D. (Tim D.) and McConville, C. F. (Chris F.). (2011) Stable passivation of InN surface electron accumulation with sulphur treatment. Physica Status Solidi (c), Vol. 8 (No. 5). pp. 1605-1607. ISSN 18626351Full text not available from this repository.
Official URL: http://dx.doi.org/10.1002/pssc.201100552
The effects of treatment with ammonium sulphide ((NH4)2Sx) solution and exposure to air for a month on the electronic properties of InN surfaces has been investigated with high resolution X-ray photoemission spectroscopy.
The valence band, In 3d, and N 1s X-ray photoemission spectra show that the surface Fermi level decreases by approximately 0.1 eV following initial (NH4)2Sx-treatment and does not change position with exposure to air for a period of up to a month.
|Item Type:||Journal Article|
|Divisions:||Faculty of Science > Physics|
|Journal or Publication Title:||Physica Status Solidi (c)|
|Publisher:||Wiley - V C H Verlag GmbH & Co. KGaA|
|Page Range:||pp. 1605-1607|
|Access rights to Published version:||Restricted or Subscription Access|
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