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The impact of parasitic inductance on the performance of silicon-carbide Schottky barrier diodes

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Alatise, Olayiwola M., Parker-Allotey, Nii-Adotei, Hamilton, Dean P. and Mawby, P. A. (Philip A.) (2012) The impact of parasitic inductance on the performance of silicon-carbide Schottky barrier diodes. IEEE Transactions on Power Electronics, Vol.27 (No.8). pp. 3826-3833. doi:10.1109/TPEL.2012.2183390 ISSN 0885-8993.

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Official URL: http://dx.doi.org/10.1109/TPEL.2012.2183390

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Abstract

1200V/300A silicon carbide Schottky barrier diode (SiC SBD) and Si pin diode modules have been tested as free-wheeling diodes under conditions of clamped inductive switching over a temperature range between -40 °C and 125 °C. Over the temperature range, the turn-OFF switching energy increases by 100% for the Si pin diode, whereas that of the SiC diode is temperature invariant and is 50% less than that of the Si pin diode at 125°C. However, the SiC SBD suffers from ringing/oscillations due to an underdamped response to an RLC circuit formed among the diode depletion capacitance, parasitic inductance, and diode resistance. These oscillations contribute to additional power losses that cause the SiC SBDs to be outperformed by the Si pin diodes at -40 °C and 0 °C. The higher depletion capacitance and lower series resistance of the SiC SBD contribute to a lower damping factor compared to the Si device. Furthermore, the positive temperature coefficient of the ON-state resistance in silicon contributes to better damping at high power levels, whereas the temperature invariance of the ON-state resistance in SiC means the oscillations persist at high temperatures. SPICE simulations and experimental measurements have been used to validate analytical expressions that have been developed for the circuit damping and oscillation frequency.

Item Type: Journal Article
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Science, Engineering and Medicine > Engineering > Engineering
Journal or Publication Title: IEEE Transactions on Power Electronics
Publisher: IEEE
ISSN: 0885-8993
Official Date: August 2012
Dates:
DateEvent
August 2012Published
Volume: Vol.27
Number: No.8
Number of Pages: 8
Page Range: pp. 3826-3833
DOI: 10.1109/TPEL.2012.2183390
Status: Not Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
Funder: Warwick-Birmingham Science City Alliance Initiative, European Regional Development Fund (ERDF), Advantage West Midlands

Data sourced from Thomson Reuters' Web of Knowledge

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