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Effect of synchronization errors on DS UWB capacity
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Zhao, Bo and Chen, Yunfei (2010) Effect of synchronization errors on DS UWB capacity. In: 2010 IEEE International Conference on Ultra-Wideband (ICUWB2010) , Nanjing, China, Sep 20-23, 2010. Published in: Ultra-Wideband (ICUWB), 2010 IEEE International Conference on, 2 pp. 1-4. doi:10.1109/ICUWB.2010.5616846
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Official URL: http://dx.doi.org/10.1109/ICUWB.2010.5616846
Abstract
The capacity of a direct sequence (DS) ultra-wide bandwidth (UWB) system is analyzed for both additive white Gaussian noise and multipath fading channels. Unlike previous works that assume perfect synchronization, our analysis takes into account synchronization errors with different distributions as well as inter-path interference, inter-chip interference and intersymbol interference. The sensitivity of the channel capacity to the synchronization error is examined. The effect of the number of users on the channel capacity is also studied. Using these results, system designers can choose appropriate system parameters to achieve good performances for different communication applications.
Item Type: | Conference Item (Paper) | ||||
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Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering | ||||
Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||
Journal or Publication Title: | Ultra-Wideband (ICUWB), 2010 IEEE International Conference on | ||||
Publisher: | IEEE | ||||
Book Title: | 2010 IEEE International Conference on Ultra-Wideband | ||||
Official Date: | 2010 | ||||
Dates: |
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Volume: | 2 | ||||
Page Range: | pp. 1-4 | ||||
DOI: | 10.1109/ICUWB.2010.5616846 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Conference Paper Type: | Paper | ||||
Title of Event: | 2010 IEEE International Conference on Ultra-Wideband (ICUWB2010) | ||||
Type of Event: | Conference | ||||
Location of Event: | Nanjing, China | ||||
Date(s) of Event: | Sep 20-23, 2010 |
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