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Investigation on split-gate RSO MOSFET for 30V breakdown
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Tong, C. F., Mawby, P. A., Covington, James A. and Pérez-Tomás, Amador (2009) Investigation on split-gate RSO MOSFET for 30V breakdown. In: 9th International Seminar on Power Semiconductors 2008 (ISPS 2008), Prague, Czech Republic, Aug 27-29, 2008. Published in: Proceedings of the 9th International Seminar on Power Semiconductors 2008 (ISPS 2008) pp. 97-102.
Full text not available from this repository.| Item Type: | Conference Item (Paper) | ||||
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| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering | ||||
| Divisions: | Faculty of Science > Engineering | ||||
| Journal or Publication Title: | Proceedings of the 9th International Seminar on Power Semiconductors 2008 (ISPS 2008) | ||||
| Publisher: | Curran Associates, Inc. | ||||
| Official Date: | October 2009 | ||||
| Dates: |
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| Page Range: | pp. 97-102 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access | ||||
| Conference Paper Type: | Paper | ||||
| Title of Event: | 9th International Seminar on Power Semiconductors 2008 (ISPS 2008) | ||||
| Type of Event: | Other | ||||
| Location of Event: | Prague, Czech Republic | ||||
| Date(s) of Event: | Aug 27-29, 2008 | ||||
| URI: | http://wrap.warwick.ac.uk/id/eprint/45947 |
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