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Investigation on split-gate RSO MOSFET for 30V breakdown

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Tong, C. F., Mawby, P. A., Covington, James A. and Pérez-Tomás, Amador (2009) Investigation on split-gate RSO MOSFET for 30V breakdown. In: 9th International Seminar on Power Semiconductors 2008 (ISPS 2008), Prague, Czech Republic, Aug 27-29, 2008. Published in: Proceedings of the 9th International Seminar on Power Semiconductors 2008 (ISPS 2008) pp. 97-102.

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Item Type: Conference Item (Paper)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Science, Engineering and Medicine > Engineering > Engineering
Journal or Publication Title: Proceedings of the 9th International Seminar on Power Semiconductors 2008 (ISPS 2008)
Publisher: Curran Associates, Inc.
Official Date: October 2009
Dates:
DateEvent
October 2009Published
Page Range: pp. 97-102
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
Conference Paper Type: Paper
Title of Event: 9th International Seminar on Power Semiconductors 2008 (ISPS 2008)
Type of Event: Other
Location of Event: Prague, Czech Republic
Date(s) of Event: Aug 27-29, 2008

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