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Post-CMOS wafer level growth of carbon nanotubes for low-cost microsensors-a proof of concept

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Santra, Sumita, Ali, Syed Z., Guha, Prasanta K., Zhong, Guofang, Robertson, J. (John), 1950-, Covington, James A., 1973-, Milne, W. I. (William I.), Gardner, J. W. (Julian W.), 1958- and Udrea, Florin. (2010) Post-CMOS wafer level growth of carbon nanotubes for low-cost microsensors-a proof of concept. Nanotechnology, Vol.21 (No.48). Article: 485301. ISSN 0957-4484

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Official URL: http://dx.doi.org/10.1088/0957-4484/21/48/485301

Abstract

Here we demonstrate a novel technique to grow carbon nanotubes (CNTs) on addressable localized areas, at wafer level, on a fully processed CMOS substrate. The CNTs were grown using tungsten micro-heaters (local growth technique) at elevated temperature on wafer scale by connecting adjacent micro-heaters through metal tracks in the scribe lane. The electrical and optical characterization show that the CNTs are identical and reproducible. We believe this wafer level integration of CNTs with CMOS circuitry enables the low-cost mass production of CNT sensors, such as chemical sensors.

Item Type: Journal Article
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Science > Engineering
Library of Congress Subject Headings (LCSH): Nanotubes, Carbon, Metal oxide semiconductors, Complementary, Detectors
Journal or Publication Title: Nanotechnology
Publisher: Institute of Physics Publishing Ltd.
ISSN: 0957-4484
Date: 3 December 2010
Volume: Vol.21
Number: No.48
Number of Pages: 7
Page Range: Article: 485301
Identification Number: 10.1088/0957-4484/21/48/485301
Status: Peer Reviewed
Publication Status: Published
Access rights to Published version: Restricted or Subscription Access
Funder: Engineering and Physical Sciences Research Council (EPSRC), European Commission (EC)
Grant number: EP/F004931/1 (EPSRC), EP/F002971/1 (EPSRC)
URI: http://wrap.warwick.ac.uk/id/eprint/4837

Data sourced from Thomson Reuters' Web of Knowledge

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