Park, Heechan, Martin, Graham R. and Bhalerao, Abhir. (2010) Local affine image matching and synthesis based on structural patterns. IEEE Transactions on Image Processing, Vol.19 (No.8). pp. 1968-1977. ISSN 1057-7149

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Abstract

A general purpose block-to-block affine transformation estimator is described. The estimator is based on Fourier slice analysis and Fourier spectral alignment. It shows encouraging performance in terms of both speed and accuracy compared to existing methods. The key elements of its success are attributed to the ability to: 1) locate an arbitrary number of affine invariant points in the spectrum that latch onto significant structural features; 2) match the estimated invariant points with the target spectrum by the slicewise phase-correlation; and 3) use affine invariant points to directly compute all linear parameters of the full affine transform by spectral alignment. Experimental results using a wide range of textures are presented. Potential applications include affine invariant image segmentation, registration, affine symmetric image coding, and motion analysis.

Item Type:	Journal Article
Subjects:	Q Science > QA Mathematics > QA76 Electronic computers. Computer science. Computer software
Divisions:	Faculty of Science > Computer Science
Library of Congress Subject Headings (LCSH):	Image processing, Image registration
Journal or Publication Title:	IEEE Transactions on Image Processing
Publisher:	IEEE
ISSN:	1057-7149
Date:	August 2010
Volume:	Vol.19
Number:	No.8
Number of Pages:	10
Page Range:	pp. 1968-1977
Identification Number:	10.1109/TIP.2010.2045704
Status:	Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Restricted or Subscription Access
URI:	http://wrap.warwick.ac.uk/id/eprint/5142

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