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Defect feature extraction using surface wave interactions and time-frequency behavior

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Dutton, B. (Ben), Rosli, M. H. and Edwards, R. S. (Rachel S.) (2010) Defect feature extraction using surface wave interactions and time-frequency behavior. In: 36th Annual Review of Progress in Quantitative Nondestructive Evaluation, University of Rhode Island, Kingston, RI, Jul 26-31, 2009. Published in: AIP Conference Proceedings, Vol.1211 (No.1). pp. 647-654.

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Official URL: http://dx.doi.org/10.1063/1.3362455

Abstract

In this paper we exploit the interaction of ultrasonic surface waves with surface cracks in order to extract defect characteristics. An experimentally validated computer model was developed to simulate laser generated surface waves interacting with defects of several depths and angles. The Rayleigh reflection coefficient vs. crack angle and depth was explored. Amplitude and frequency behaviour at the defect interface in aluminium samples was also considered. Additionally, the phase component of the FFT was used to extract similar information. Finally, we explore the time-frequency behaviour using the Wigner transform.

Item Type:	Conference Item (Paper)
Subjects:	Q Science > QC Physics T Technology > TA Engineering (General). Civil engineering (General)
Divisions:	Faculty of Science > Physics
Library of Congress Subject Headings (LCSH):	Ultrasonic testing, Rayleigh waves, Nondestructive testing, Surface waves, Surfaces (Technology) -- Defects
Journal or Publication Title:	AIP Conference Proceedings
Publisher:	American Institute of Physics
ISBN:	9780735407480
ISSN:	0094-243X
Editor:	Thompson, DO and Chimenti, DE
Date:	22 February 2010
Volume:	Vol.1211
Number:	No.1
Number of Pages:	8
Page Range:	pp. 647-654
Identification Number:	10.1063/1.3362455
Status:	Peer Reviewed
Publication Status:	Published
Access rights to Published version:	Restricted or Subscription Access
Funder:	European Research Council (ERC)
Grant number:	202735 (ERC)
Conference Paper Type:	Paper
Title of Event:	36th Annual Review of Progress in Quantitative Nondestructive Evaluation
Type of Event:	Conference
Location of Event:	University of Rhode Island, Kingston, RI
Date(s) of Event:	Jul 26-31, 2009
References:	1. Hatfield Derailment. 2000; Available from: www.hse.gov.uk. 2. Boonsang, S. and R.J. Dewhurst, Applied Physics Letters, 82, 3348-3350, (2003). 3. Cheeke, J.D.N., Fundamentals and Applications of Ultrasonic Waves, CRC Press, Boca Raton, Florida, 2002, pp. 143-149. 4. Dixon, S., et al., Nondestructive Testing and Evaluation, 23, 25-34, (2008). 5. Edwards, R.S., S. Dixon, and X. Jian, NDT & E International, 39, 468-475, (2006). 6. Edwards, R.S., et al., Applied Physics Letters, 87, 3, (2005). 7. Edwards, R.S., et al. 32nd Annual Review of Process in Quantitative Nondestructive Evaluation Amer. Inst. Physics, Brunswick, ME, 2005. 8. Fan, Y., et al., NDT & E International, 40, 471-477, (2007). 9. Jian, X., et al., Journal of Applied Physics, 101, 7, (2007). 10. Jian, X., et al., Journal of Applied Physics, 100, 6, (2006). 11. Kinra, V.K., Journal of the Acoustical Society of America, 79, 1688-1692, (1986). 12. Kromine, A.K., et al., 26th Annual Review of Progress in Quantitative Nondestructive Evaluation, Amer. Inst. Physics, Montreal, Canada, 1999. 13. Vu, B.Q. and V.K. Kinra, Journal of the Acoustical Society of America, 77, 1425-1430, (1985). 14. Scruby, C.B. and L.E. Drain, Laser Ultrasonics: Techniques and Applications, Adam Hilger, Bristol, England, 1990, ps. 261,305. 15. Viktorov, I.A., Rayleigh and Lamb Waves: Physical Theory and Applications, Plenum Press, New York, 1967, pp. 5-6. 16. Arias, I. and J.D. Achenbach, International Journal of Solids and Structures, 40, 6917-6935, (2003). 17. Arias, I. and J.D. Achenbach, Wave Motion, 39, 61-75, (2004). 18. Aindow, A.M., R.J. Dewhurst, and S.B. Palmer, Optics Communications, 42, 116-120, (1982). 19. Hutchins, D.A., Canadian Journal of Physics, 64, 1247-1264, (1986). 20. Babich, V.M., et al., NDT & E International, 37, 105-109 (2004). 21. Wright, P.S. 1998 Conference on Precision Electromagnetic Measurements (CPEM 98), IEEE-Inst. Electrical Electronics Engineers Inc., Washington, D.C., 1998. 22. Bartelt, H.O., K.H. Brenner, and A.W. Lohmann, Optics Communications, 32, 32-38, (1980). 23. Wigner, E., Physical Review, 40, 749-759, (1932).
URI:	http://wrap.warwick.ac.uk/id/eprint/5146